A new parafocusing paradigm for X-ray diffraction

A new approach to parafocusing X-ray diffraction implemented with an annular incident beam is demonstrated for the first time. The method exploits an elliptical specimen path on a flat sample to produce relatively high intensity maxima that can be measured with a point detector. It is shown that the...

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Detalles Bibliográficos
Autores principales: Prokopiou, Danae, McGovern, James, Davies, Gareth, Godber, Simon, Evans, Paul, Dicken, Anthony, Rogers, Keith
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2020
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7401784/
https://www.ncbi.nlm.nih.gov/pubmed/32788904
http://dx.doi.org/10.1107/S1600576720008651
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author Prokopiou, Danae
McGovern, James
Davies, Gareth
Godber, Simon
Evans, Paul
Dicken, Anthony
Rogers, Keith
author_facet Prokopiou, Danae
McGovern, James
Davies, Gareth
Godber, Simon
Evans, Paul
Dicken, Anthony
Rogers, Keith
author_sort Prokopiou, Danae
collection PubMed
description A new approach to parafocusing X-ray diffraction implemented with an annular incident beam is demonstrated for the first time. The method exploits an elliptical specimen path on a flat sample to produce relatively high intensity maxima that can be measured with a point detector. It is shown that the flat-specimen approximation tolerated by conventional Bragg–Brentano geometries is not required. A theoretical framework, simulations and experimental results for both angular- and energy-dispersive measurement modes are presented and the scattering signatures compared with data obtained with a conventional pencil-beam arrangement.
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spelling pubmed-74017842020-08-11 A new parafocusing paradigm for X-ray diffraction Prokopiou, Danae McGovern, James Davies, Gareth Godber, Simon Evans, Paul Dicken, Anthony Rogers, Keith J Appl Crystallogr Research Papers A new approach to parafocusing X-ray diffraction implemented with an annular incident beam is demonstrated for the first time. The method exploits an elliptical specimen path on a flat sample to produce relatively high intensity maxima that can be measured with a point detector. It is shown that the flat-specimen approximation tolerated by conventional Bragg–Brentano geometries is not required. A theoretical framework, simulations and experimental results for both angular- and energy-dispersive measurement modes are presented and the scattering signatures compared with data obtained with a conventional pencil-beam arrangement. International Union of Crystallography 2020-07-24 /pmc/articles/PMC7401784/ /pubmed/32788904 http://dx.doi.org/10.1107/S1600576720008651 Text en © Danae Prokopiou et al. 2020 http://creativecommons.org/licenses/by/4.0/ This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.http://creativecommons.org/licenses/by/4.0/
spellingShingle Research Papers
Prokopiou, Danae
McGovern, James
Davies, Gareth
Godber, Simon
Evans, Paul
Dicken, Anthony
Rogers, Keith
A new parafocusing paradigm for X-ray diffraction
title A new parafocusing paradigm for X-ray diffraction
title_full A new parafocusing paradigm for X-ray diffraction
title_fullStr A new parafocusing paradigm for X-ray diffraction
title_full_unstemmed A new parafocusing paradigm for X-ray diffraction
title_short A new parafocusing paradigm for X-ray diffraction
title_sort new parafocusing paradigm for x-ray diffraction
topic Research Papers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7401784/
https://www.ncbi.nlm.nih.gov/pubmed/32788904
http://dx.doi.org/10.1107/S1600576720008651
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