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A new parafocusing paradigm for X-ray diffraction

A new approach to parafocusing X-ray diffraction implemented with an annular incident beam is demonstrated for the first time. The method exploits an elliptical specimen path on a flat sample to produce relatively high intensity maxima that can be measured with a point detector. It is shown that the...

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Detalles Bibliográficos
Autores principales: Prokopiou, Danae, McGovern, James, Davies, Gareth, Godber, Simon, Evans, Paul, Dicken, Anthony, Rogers, Keith
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7401784/
https://www.ncbi.nlm.nih.gov/pubmed/32788904
http://dx.doi.org/10.1107/S1600576720008651

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