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Pulse-to-pulse wavefront sensing at free-electron lasers using ptychography

The pressing need for knowledge of the detailed wavefront properties of ultra-bright and ultra-short pulses produced by free-electron lasers has spurred the development of several complementary characterization approaches. Here a method based on ptychography is presented that can retrieve high-resol...

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Detalles Bibliográficos
Autores principales: Sala, Simone, Daurer, Benedikt J., Odstrcil, Michal, Capotondi, Flavio, Pedersoli, Emanuele, Hantke, Max F., Manfredda, Michele, Loh, N. Duane, Thibault, Pierre, Maia, Filipe R. N. C.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7401787/
https://www.ncbi.nlm.nih.gov/pubmed/32788902
http://dx.doi.org/10.1107/S1600576720006913
Descripción
Sumario:The pressing need for knowledge of the detailed wavefront properties of ultra-bright and ultra-short pulses produced by free-electron lasers has spurred the development of several complementary characterization approaches. Here a method based on ptychography is presented that can retrieve high-resolution complex-valued wavefunctions of individual pulses without strong constraints on the illumination or sample object used. The technique is demonstrated within experimental conditions suited for diffraction experiments and exploiting Kirkpatrick–Baez focusing optics. This lensless technique, applicable to many other short-pulse instruments, can achieve diffraction-limited resolution.