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Ptychographic X-ray speckle tracking with multi-layer Laue lens systems
The ever-increasing brightness of synchrotron radiation sources demands improved X-ray optics to utilize their capability for imaging and probing biological cells, nano-devices and functional matter on the nanometre scale with chemical sensitivity. Hard X-rays are ideal for high-resolution imaging a...
Autores principales: | , , , , , , , , , , , , , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7401788/ https://www.ncbi.nlm.nih.gov/pubmed/32788900 http://dx.doi.org/10.1107/S1600576720006925 |
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author | Morgan, Andrew J. Murray, Kevin T. Prasciolu, Mauro Fleckenstein, Holger Yefanov, Oleksandr Villanueva-Perez, Pablo Mariani, Valerio Domaracky, Martin Kuhn, Manuela Aplin, Steve Mohacsi, Istvan Messerschmidt, Marc Stachnik, Karolina Du, Yang Burkhart, Anja Meents, Alke Nazaretski, Evgeny Yan, Hanfei Huang, Xiaojing Chu, Yong S. Chapman, Henry N. Bajt, Saša |
author_facet | Morgan, Andrew J. Murray, Kevin T. Prasciolu, Mauro Fleckenstein, Holger Yefanov, Oleksandr Villanueva-Perez, Pablo Mariani, Valerio Domaracky, Martin Kuhn, Manuela Aplin, Steve Mohacsi, Istvan Messerschmidt, Marc Stachnik, Karolina Du, Yang Burkhart, Anja Meents, Alke Nazaretski, Evgeny Yan, Hanfei Huang, Xiaojing Chu, Yong S. Chapman, Henry N. Bajt, Saša |
author_sort | Morgan, Andrew J. |
collection | PubMed |
description | The ever-increasing brightness of synchrotron radiation sources demands improved X-ray optics to utilize their capability for imaging and probing biological cells, nano-devices and functional matter on the nanometre scale with chemical sensitivity. Hard X-rays are ideal for high-resolution imaging and spectroscopic applications owing to their short wavelength, high penetrating power and chemical sensitivity. The penetrating power that makes X-rays useful for imaging also makes focusing them technologically challenging. Recent developments in layer deposition techniques have enabled the fabrication of a series of highly focusing X-ray lenses, known as wedged multi-layer Laue lenses. Improvements to the lens design and fabrication technique demand an accurate, robust, in situ and at-wavelength characterization method. To this end, a modified form of the speckle tracking wavefront metrology method has been developed. The ptychographic X-ray speckle tracking method is capable of operating with highly divergent wavefields. A useful by-product of this method is that it also provides high-resolution and aberration-free projection images of extended specimens. Three separate experiments using this method are reported, where the ray path angles have been resolved to within 4 nrad with an imaging resolution of 45 nm (full period). This method does not require a high degree of coherence, making it suitable for laboratory-based X-ray sources. Likewise, it is robust to errors in the registered sample positions, making it suitable for X-ray free-electron laser facilities, where beam-pointing fluctuations can be problematic for wavefront metrology. |
format | Online Article Text |
id | pubmed-7401788 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | International Union of Crystallography |
record_format | MEDLINE/PubMed |
spelling | pubmed-74017882020-08-11 Ptychographic X-ray speckle tracking with multi-layer Laue lens systems Morgan, Andrew J. Murray, Kevin T. Prasciolu, Mauro Fleckenstein, Holger Yefanov, Oleksandr Villanueva-Perez, Pablo Mariani, Valerio Domaracky, Martin Kuhn, Manuela Aplin, Steve Mohacsi, Istvan Messerschmidt, Marc Stachnik, Karolina Du, Yang Burkhart, Anja Meents, Alke Nazaretski, Evgeny Yan, Hanfei Huang, Xiaojing Chu, Yong S. Chapman, Henry N. Bajt, Saša J Appl Crystallogr Research Papers The ever-increasing brightness of synchrotron radiation sources demands improved X-ray optics to utilize their capability for imaging and probing biological cells, nano-devices and functional matter on the nanometre scale with chemical sensitivity. Hard X-rays are ideal for high-resolution imaging and spectroscopic applications owing to their short wavelength, high penetrating power and chemical sensitivity. The penetrating power that makes X-rays useful for imaging also makes focusing them technologically challenging. Recent developments in layer deposition techniques have enabled the fabrication of a series of highly focusing X-ray lenses, known as wedged multi-layer Laue lenses. Improvements to the lens design and fabrication technique demand an accurate, robust, in situ and at-wavelength characterization method. To this end, a modified form of the speckle tracking wavefront metrology method has been developed. The ptychographic X-ray speckle tracking method is capable of operating with highly divergent wavefields. A useful by-product of this method is that it also provides high-resolution and aberration-free projection images of extended specimens. Three separate experiments using this method are reported, where the ray path angles have been resolved to within 4 nrad with an imaging resolution of 45 nm (full period). This method does not require a high degree of coherence, making it suitable for laboratory-based X-ray sources. Likewise, it is robust to errors in the registered sample positions, making it suitable for X-ray free-electron laser facilities, where beam-pointing fluctuations can be problematic for wavefront metrology. International Union of Crystallography 2020-07-08 /pmc/articles/PMC7401788/ /pubmed/32788900 http://dx.doi.org/10.1107/S1600576720006925 Text en © Andrew J. Morgan et al. 2020 http://creativecommons.org/licenses/by/4.0/ This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.http://creativecommons.org/licenses/by/4.0/ |
spellingShingle | Research Papers Morgan, Andrew J. Murray, Kevin T. Prasciolu, Mauro Fleckenstein, Holger Yefanov, Oleksandr Villanueva-Perez, Pablo Mariani, Valerio Domaracky, Martin Kuhn, Manuela Aplin, Steve Mohacsi, Istvan Messerschmidt, Marc Stachnik, Karolina Du, Yang Burkhart, Anja Meents, Alke Nazaretski, Evgeny Yan, Hanfei Huang, Xiaojing Chu, Yong S. Chapman, Henry N. Bajt, Saša Ptychographic X-ray speckle tracking with multi-layer Laue lens systems |
title | Ptychographic X-ray speckle tracking with multi-layer Laue lens systems
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title_full | Ptychographic X-ray speckle tracking with multi-layer Laue lens systems
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title_fullStr | Ptychographic X-ray speckle tracking with multi-layer Laue lens systems
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title_full_unstemmed | Ptychographic X-ray speckle tracking with multi-layer Laue lens systems
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title_short | Ptychographic X-ray speckle tracking with multi-layer Laue lens systems
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title_sort | ptychographic x-ray speckle tracking with multi-layer laue lens systems |
topic | Research Papers |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7401788/ https://www.ncbi.nlm.nih.gov/pubmed/32788900 http://dx.doi.org/10.1107/S1600576720006925 |
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