Cargando…

Design and Characterization of an EEG-Hat for Reliable EEG Measurements

In this study, a new hat-type electroencephalogram (EEG) device with candle-like microneedle electrodes (CMEs), called an EEG-Hat, was designed and fabricated. CMEs are dry EEG electrodes that can measure high-quality EEG signals without skin treatment or conductive gels. One of the challenges in th...

Descripción completa

Detalles Bibliográficos
Autores principales: Kawana, Takumi, Yoshida, Yuri, Kudo, Yuta, Iwatani, Chiho, Miki, Norihisa
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7407528/
https://www.ncbi.nlm.nih.gov/pubmed/32605330
http://dx.doi.org/10.3390/mi11070635
_version_ 1783567641999310848
author Kawana, Takumi
Yoshida, Yuri
Kudo, Yuta
Iwatani, Chiho
Miki, Norihisa
author_facet Kawana, Takumi
Yoshida, Yuri
Kudo, Yuta
Iwatani, Chiho
Miki, Norihisa
author_sort Kawana, Takumi
collection PubMed
description In this study, a new hat-type electroencephalogram (EEG) device with candle-like microneedle electrodes (CMEs), called an EEG-Hat, was designed and fabricated. CMEs are dry EEG electrodes that can measure high-quality EEG signals without skin treatment or conductive gels. One of the challenges in the measurement of high-quality EEG signals is the fixation of electrodes to the skin, i.e., the design of a good EEG headset. The CMEs were able to achieve good contact with the scalp for heads of different sizes and shapes, and the EEG-Hat has a shutter mechanism to separate the hair and ensure good contact between the CMEs and the scalp. Simultaneous measurement of EEG signals from five measurement points on the scalp was successfully conducted after a simple and brief setup process. The EEG-Hat is expected to contribute to the advancement of EEG research.
format Online
Article
Text
id pubmed-7407528
institution National Center for Biotechnology Information
language English
publishDate 2020
publisher MDPI
record_format MEDLINE/PubMed
spelling pubmed-74075282020-08-25 Design and Characterization of an EEG-Hat for Reliable EEG Measurements Kawana, Takumi Yoshida, Yuri Kudo, Yuta Iwatani, Chiho Miki, Norihisa Micromachines (Basel) Article In this study, a new hat-type electroencephalogram (EEG) device with candle-like microneedle electrodes (CMEs), called an EEG-Hat, was designed and fabricated. CMEs are dry EEG electrodes that can measure high-quality EEG signals without skin treatment or conductive gels. One of the challenges in the measurement of high-quality EEG signals is the fixation of electrodes to the skin, i.e., the design of a good EEG headset. The CMEs were able to achieve good contact with the scalp for heads of different sizes and shapes, and the EEG-Hat has a shutter mechanism to separate the hair and ensure good contact between the CMEs and the scalp. Simultaneous measurement of EEG signals from five measurement points on the scalp was successfully conducted after a simple and brief setup process. The EEG-Hat is expected to contribute to the advancement of EEG research. MDPI 2020-06-28 /pmc/articles/PMC7407528/ /pubmed/32605330 http://dx.doi.org/10.3390/mi11070635 Text en © 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Kawana, Takumi
Yoshida, Yuri
Kudo, Yuta
Iwatani, Chiho
Miki, Norihisa
Design and Characterization of an EEG-Hat for Reliable EEG Measurements
title Design and Characterization of an EEG-Hat for Reliable EEG Measurements
title_full Design and Characterization of an EEG-Hat for Reliable EEG Measurements
title_fullStr Design and Characterization of an EEG-Hat for Reliable EEG Measurements
title_full_unstemmed Design and Characterization of an EEG-Hat for Reliable EEG Measurements
title_short Design and Characterization of an EEG-Hat for Reliable EEG Measurements
title_sort design and characterization of an eeg-hat for reliable eeg measurements
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7407528/
https://www.ncbi.nlm.nih.gov/pubmed/32605330
http://dx.doi.org/10.3390/mi11070635
work_keys_str_mv AT kawanatakumi designandcharacterizationofaneeghatforreliableeegmeasurements
AT yoshidayuri designandcharacterizationofaneeghatforreliableeegmeasurements
AT kudoyuta designandcharacterizationofaneeghatforreliableeegmeasurements
AT iwatanichiho designandcharacterizationofaneeghatforreliableeegmeasurements
AT mikinorihisa designandcharacterizationofaneeghatforreliableeegmeasurements