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Perspectives on single particle imaging with x rays at the advent of high repetition rate x-ray free electron laser sources

X-ray free electron lasers (XFELs) now routinely produce millijoule level pulses of x-ray photons with tens of femtoseconds duration. Such x-ray intensities gave rise to the idea that weakly scattering particles—perhaps single biomolecules or viruses—could be investigated free of radiation damage. H...

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Detalles Bibliográficos
Autores principales: Bielecki, Johan, Maia, Filipe R. N. C., Mancuso, Adrian P.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Crystallographic Association 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7413746/
https://www.ncbi.nlm.nih.gov/pubmed/32818147
http://dx.doi.org/10.1063/4.0000024
Descripción
Sumario:X-ray free electron lasers (XFELs) now routinely produce millijoule level pulses of x-ray photons with tens of femtoseconds duration. Such x-ray intensities gave rise to the idea that weakly scattering particles—perhaps single biomolecules or viruses—could be investigated free of radiation damage. Here, we examine elements from the past decade of so-called single particle imaging with hard XFELs. We look at the progress made to date and identify some future possible directions for the field. In particular, we summarize the presently achieved resolutions as well as identifying the bottlenecks and enabling technologies to future resolution improvement, which in turn enables application to samples of scientific interest.