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In-situ monitoring of an organic sample with electric field determination during cold plasma jet exposure

Pockels-based Mueller polarimetry is presented as a novel diagnostic technique for studying time and space-resolved and in-situ the interaction between an organic sample (a layer of onion cells) and non-thermal atmospheric pressure plasma. The effect of plasma is complex, as it delivers electric fie...

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Autores principales: Slikboer, Elmar, Sobota, Ana, Garcia-Caurel, Enric, Guaitella, Olivier
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7423608/
https://www.ncbi.nlm.nih.gov/pubmed/32788628
http://dx.doi.org/10.1038/s41598-020-70452-w
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author Slikboer, Elmar
Sobota, Ana
Garcia-Caurel, Enric
Guaitella, Olivier
author_facet Slikboer, Elmar
Sobota, Ana
Garcia-Caurel, Enric
Guaitella, Olivier
author_sort Slikboer, Elmar
collection PubMed
description Pockels-based Mueller polarimetry is presented as a novel diagnostic technique for studying time and space-resolved and in-situ the interaction between an organic sample (a layer of onion cells) and non-thermal atmospheric pressure plasma. The effect of plasma is complex, as it delivers electric field, radicals, (UV) radiation, non-uniform in time nor in space. This work shows for the first time that the plasma-surface interaction can be characterized through the induced electric field in an electro-optic crystal (birefringence caused by the Pockels effect) while at the same moment the surface evolution of the targeted sample is monitored (depolarization) which is attached to the crystal. As Mueller polarimetry allows for separate detection of depolarization and birefringence, it is possible to decouple the entangled effects of the plasma. In the sample three spatial regions are identified where the surface evolution of the sample differs. This directly relates to the spatial in-homogeneity of the plasma at the surface characterized through the detected electric field. The method can be applied in the future to investigate plasma-surface interactions for various targets ranging from bio-films, to catalytic surfaces and plastics/polymers.
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spelling pubmed-74236082020-08-13 In-situ monitoring of an organic sample with electric field determination during cold plasma jet exposure Slikboer, Elmar Sobota, Ana Garcia-Caurel, Enric Guaitella, Olivier Sci Rep Article Pockels-based Mueller polarimetry is presented as a novel diagnostic technique for studying time and space-resolved and in-situ the interaction between an organic sample (a layer of onion cells) and non-thermal atmospheric pressure plasma. The effect of plasma is complex, as it delivers electric field, radicals, (UV) radiation, non-uniform in time nor in space. This work shows for the first time that the plasma-surface interaction can be characterized through the induced electric field in an electro-optic crystal (birefringence caused by the Pockels effect) while at the same moment the surface evolution of the targeted sample is monitored (depolarization) which is attached to the crystal. As Mueller polarimetry allows for separate detection of depolarization and birefringence, it is possible to decouple the entangled effects of the plasma. In the sample three spatial regions are identified where the surface evolution of the sample differs. This directly relates to the spatial in-homogeneity of the plasma at the surface characterized through the detected electric field. The method can be applied in the future to investigate plasma-surface interactions for various targets ranging from bio-films, to catalytic surfaces and plastics/polymers. Nature Publishing Group UK 2020-08-12 /pmc/articles/PMC7423608/ /pubmed/32788628 http://dx.doi.org/10.1038/s41598-020-70452-w Text en © The Author(s) 2020 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Slikboer, Elmar
Sobota, Ana
Garcia-Caurel, Enric
Guaitella, Olivier
In-situ monitoring of an organic sample with electric field determination during cold plasma jet exposure
title In-situ monitoring of an organic sample with electric field determination during cold plasma jet exposure
title_full In-situ monitoring of an organic sample with electric field determination during cold plasma jet exposure
title_fullStr In-situ monitoring of an organic sample with electric field determination during cold plasma jet exposure
title_full_unstemmed In-situ monitoring of an organic sample with electric field determination during cold plasma jet exposure
title_short In-situ monitoring of an organic sample with electric field determination during cold plasma jet exposure
title_sort in-situ monitoring of an organic sample with electric field determination during cold plasma jet exposure
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7423608/
https://www.ncbi.nlm.nih.gov/pubmed/32788628
http://dx.doi.org/10.1038/s41598-020-70452-w
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