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A new method for assessment of nickel-titanium endodontic instrument surface roughness using field emission scanning electronic microscope

BACKGROUND: To introduce a new method for measurement of surface roughness of the endodontic instrument, before and after instrumentation, using the Field Emission Scanning Electronic Microscope (FE-SEM) combined with the ImageJ software. METHODS: Twenty J-shape resin blocks were divided into two gr...

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Autores principales: Van Pham, Khoa, Vo, Canh Quang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: BioMed Central 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7461342/
https://www.ncbi.nlm.nih.gov/pubmed/32867760
http://dx.doi.org/10.1186/s12903-020-01233-0
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author Van Pham, Khoa
Vo, Canh Quang
author_facet Van Pham, Khoa
Vo, Canh Quang
author_sort Van Pham, Khoa
collection PubMed
description BACKGROUND: To introduce a new method for measurement of surface roughness of the endodontic instrument, before and after instrumentation, using the Field Emission Scanning Electronic Microscope (FE-SEM) combined with the ImageJ software. METHODS: Twenty J-shape resin blocks were divided into two groups, ten blocks of each group. Simulated root canal inside the resin block was 16 mm length, 60(0) angle of curvature, and radius of 4.5 mm. Ten WaveOne Gold Primary and 10 Reciproc Blue R25 instruments were used for root canal instrumentation. The instruments were scanned before and after instrumentation with special molds made to ensure the same areas at the point located 3 mm from the tips of the instruments using the FE-SEM. These scanned images were analyzed using the ImageJ. The arithmetical mean roughness (R(a)), root mean square roughness (R(q)), and the average distance between the highest peak and lowest valley in each sampling length (R(z)) were calculated by ImageJ for quantitative analyses. The paired-t test was performed to analyze the data using the SPSS 22.0 at the significance of .05. RESULTS: Almost all surface roughness values were decreased. However, these decreases were not statistically significant (P > .05). CONCLUSIONS: The FE-SEM combined with the ImageJ was the reliable and appropriate modality for measurement surface roughness of instruments.
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spelling pubmed-74613422020-09-02 A new method for assessment of nickel-titanium endodontic instrument surface roughness using field emission scanning electronic microscope Van Pham, Khoa Vo, Canh Quang BMC Oral Health Research Article BACKGROUND: To introduce a new method for measurement of surface roughness of the endodontic instrument, before and after instrumentation, using the Field Emission Scanning Electronic Microscope (FE-SEM) combined with the ImageJ software. METHODS: Twenty J-shape resin blocks were divided into two groups, ten blocks of each group. Simulated root canal inside the resin block was 16 mm length, 60(0) angle of curvature, and radius of 4.5 mm. Ten WaveOne Gold Primary and 10 Reciproc Blue R25 instruments were used for root canal instrumentation. The instruments were scanned before and after instrumentation with special molds made to ensure the same areas at the point located 3 mm from the tips of the instruments using the FE-SEM. These scanned images were analyzed using the ImageJ. The arithmetical mean roughness (R(a)), root mean square roughness (R(q)), and the average distance between the highest peak and lowest valley in each sampling length (R(z)) were calculated by ImageJ for quantitative analyses. The paired-t test was performed to analyze the data using the SPSS 22.0 at the significance of .05. RESULTS: Almost all surface roughness values were decreased. However, these decreases were not statistically significant (P > .05). CONCLUSIONS: The FE-SEM combined with the ImageJ was the reliable and appropriate modality for measurement surface roughness of instruments. BioMed Central 2020-08-31 /pmc/articles/PMC7461342/ /pubmed/32867760 http://dx.doi.org/10.1186/s12903-020-01233-0 Text en © The Author(s) 2020 Open AccessThis article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/. The Creative Commons Public Domain Dedication waiver (http://creativecommons.org/publicdomain/zero/1.0/) applies to the data made available in this article, unless otherwise stated in a credit line to the data.
spellingShingle Research Article
Van Pham, Khoa
Vo, Canh Quang
A new method for assessment of nickel-titanium endodontic instrument surface roughness using field emission scanning electronic microscope
title A new method for assessment of nickel-titanium endodontic instrument surface roughness using field emission scanning electronic microscope
title_full A new method for assessment of nickel-titanium endodontic instrument surface roughness using field emission scanning electronic microscope
title_fullStr A new method for assessment of nickel-titanium endodontic instrument surface roughness using field emission scanning electronic microscope
title_full_unstemmed A new method for assessment of nickel-titanium endodontic instrument surface roughness using field emission scanning electronic microscope
title_short A new method for assessment of nickel-titanium endodontic instrument surface roughness using field emission scanning electronic microscope
title_sort new method for assessment of nickel-titanium endodontic instrument surface roughness using field emission scanning electronic microscope
topic Research Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7461342/
https://www.ncbi.nlm.nih.gov/pubmed/32867760
http://dx.doi.org/10.1186/s12903-020-01233-0
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