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Reliability of Miniaturized Transistors from the Perspective of Single-Defects
To analyze the reliability of semiconductor transistors, changes in the performance of the devices during operation are evaluated. A prominent effect altering the device behavior are the so called bias temperature instabilities (BTI), which emerge as a drift of the device threshold voltage over time...
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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MDPI
2020
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7465540/ https://www.ncbi.nlm.nih.gov/pubmed/32751280 http://dx.doi.org/10.3390/mi11080736 |