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Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence

This paper proposes and demonstrates a simple method using the intensity correlation of X-ray fluorescence to evaluate the focused beam size of an X-ray free-electron laser (XFEL). This method was applied to the sub-micrometre focused XFEL beam at the SPring-8 Angstrom Compact Free Electron Laser, a...

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Autores principales: Nakamura, Nami, Matsuyama, Satoshi, Inoue, Takato, Inoue, Ichiro, Yamada, Jumpei, Osaka, Taito, Yabashi, Makina, Ishikawa, Tetsuya, Yamauchi, Kazuto
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7467341/
https://www.ncbi.nlm.nih.gov/pubmed/32876613
http://dx.doi.org/10.1107/S1600577520009868
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author Nakamura, Nami
Matsuyama, Satoshi
Inoue, Takato
Inoue, Ichiro
Yamada, Jumpei
Osaka, Taito
Yabashi, Makina
Ishikawa, Tetsuya
Yamauchi, Kazuto
author_facet Nakamura, Nami
Matsuyama, Satoshi
Inoue, Takato
Inoue, Ichiro
Yamada, Jumpei
Osaka, Taito
Yabashi, Makina
Ishikawa, Tetsuya
Yamauchi, Kazuto
author_sort Nakamura, Nami
collection PubMed
description This paper proposes and demonstrates a simple method using the intensity correlation of X-ray fluorescence to evaluate the focused beam size of an X-ray free-electron laser (XFEL). This method was applied to the sub-micrometre focused XFEL beam at the SPring-8 Angstrom Compact Free Electron Laser, and the beam size evaluated using the proposed method was consistent with that measured using the knife-edge scan method. The proposed method is readily applicable to extremely small X-ray spots and can be applied for the precise diagnostics of sub-10 nm focused X-ray beams which have recently emerged.
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spelling pubmed-74673412020-09-15 Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence Nakamura, Nami Matsuyama, Satoshi Inoue, Takato Inoue, Ichiro Yamada, Jumpei Osaka, Taito Yabashi, Makina Ishikawa, Tetsuya Yamauchi, Kazuto J Synchrotron Radiat Short Communications This paper proposes and demonstrates a simple method using the intensity correlation of X-ray fluorescence to evaluate the focused beam size of an X-ray free-electron laser (XFEL). This method was applied to the sub-micrometre focused XFEL beam at the SPring-8 Angstrom Compact Free Electron Laser, and the beam size evaluated using the proposed method was consistent with that measured using the knife-edge scan method. The proposed method is readily applicable to extremely small X-ray spots and can be applied for the precise diagnostics of sub-10 nm focused X-ray beams which have recently emerged. International Union of Crystallography 2020-08-17 /pmc/articles/PMC7467341/ /pubmed/32876613 http://dx.doi.org/10.1107/S1600577520009868 Text en © Nami Nakamura et al. 2020 http://creativecommons.org/licenses/by/4.0/ This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.http://creativecommons.org/licenses/by/4.0/
spellingShingle Short Communications
Nakamura, Nami
Matsuyama, Satoshi
Inoue, Takato
Inoue, Ichiro
Yamada, Jumpei
Osaka, Taito
Yabashi, Makina
Ishikawa, Tetsuya
Yamauchi, Kazuto
Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence
title Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence
title_full Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence
title_fullStr Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence
title_full_unstemmed Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence
title_short Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence
title_sort focus characterization of an x-ray free-electron laser by intensity correlation measurement of x-ray fluorescence
topic Short Communications
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7467341/
https://www.ncbi.nlm.nih.gov/pubmed/32876613
http://dx.doi.org/10.1107/S1600577520009868
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