Cargando…
Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence
This paper proposes and demonstrates a simple method using the intensity correlation of X-ray fluorescence to evaluate the focused beam size of an X-ray free-electron laser (XFEL). This method was applied to the sub-micrometre focused XFEL beam at the SPring-8 Angstrom Compact Free Electron Laser, a...
Autores principales: | , , , , , , , , |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2020
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7467341/ https://www.ncbi.nlm.nih.gov/pubmed/32876613 http://dx.doi.org/10.1107/S1600577520009868 |
_version_ | 1783577992009613312 |
---|---|
author | Nakamura, Nami Matsuyama, Satoshi Inoue, Takato Inoue, Ichiro Yamada, Jumpei Osaka, Taito Yabashi, Makina Ishikawa, Tetsuya Yamauchi, Kazuto |
author_facet | Nakamura, Nami Matsuyama, Satoshi Inoue, Takato Inoue, Ichiro Yamada, Jumpei Osaka, Taito Yabashi, Makina Ishikawa, Tetsuya Yamauchi, Kazuto |
author_sort | Nakamura, Nami |
collection | PubMed |
description | This paper proposes and demonstrates a simple method using the intensity correlation of X-ray fluorescence to evaluate the focused beam size of an X-ray free-electron laser (XFEL). This method was applied to the sub-micrometre focused XFEL beam at the SPring-8 Angstrom Compact Free Electron Laser, and the beam size evaluated using the proposed method was consistent with that measured using the knife-edge scan method. The proposed method is readily applicable to extremely small X-ray spots and can be applied for the precise diagnostics of sub-10 nm focused X-ray beams which have recently emerged. |
format | Online Article Text |
id | pubmed-7467341 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | International Union of Crystallography |
record_format | MEDLINE/PubMed |
spelling | pubmed-74673412020-09-15 Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence Nakamura, Nami Matsuyama, Satoshi Inoue, Takato Inoue, Ichiro Yamada, Jumpei Osaka, Taito Yabashi, Makina Ishikawa, Tetsuya Yamauchi, Kazuto J Synchrotron Radiat Short Communications This paper proposes and demonstrates a simple method using the intensity correlation of X-ray fluorescence to evaluate the focused beam size of an X-ray free-electron laser (XFEL). This method was applied to the sub-micrometre focused XFEL beam at the SPring-8 Angstrom Compact Free Electron Laser, and the beam size evaluated using the proposed method was consistent with that measured using the knife-edge scan method. The proposed method is readily applicable to extremely small X-ray spots and can be applied for the precise diagnostics of sub-10 nm focused X-ray beams which have recently emerged. International Union of Crystallography 2020-08-17 /pmc/articles/PMC7467341/ /pubmed/32876613 http://dx.doi.org/10.1107/S1600577520009868 Text en © Nami Nakamura et al. 2020 http://creativecommons.org/licenses/by/4.0/ This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.http://creativecommons.org/licenses/by/4.0/ |
spellingShingle | Short Communications Nakamura, Nami Matsuyama, Satoshi Inoue, Takato Inoue, Ichiro Yamada, Jumpei Osaka, Taito Yabashi, Makina Ishikawa, Tetsuya Yamauchi, Kazuto Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence |
title | Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence |
title_full | Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence |
title_fullStr | Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence |
title_full_unstemmed | Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence |
title_short | Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence |
title_sort | focus characterization of an x-ray free-electron laser by intensity correlation measurement of x-ray fluorescence |
topic | Short Communications |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7467341/ https://www.ncbi.nlm.nih.gov/pubmed/32876613 http://dx.doi.org/10.1107/S1600577520009868 |
work_keys_str_mv | AT nakamuranami focuscharacterizationofanxrayfreeelectronlaserbyintensitycorrelationmeasurementofxrayfluorescence AT matsuyamasatoshi focuscharacterizationofanxrayfreeelectronlaserbyintensitycorrelationmeasurementofxrayfluorescence AT inouetakato focuscharacterizationofanxrayfreeelectronlaserbyintensitycorrelationmeasurementofxrayfluorescence AT inoueichiro focuscharacterizationofanxrayfreeelectronlaserbyintensitycorrelationmeasurementofxrayfluorescence AT yamadajumpei focuscharacterizationofanxrayfreeelectronlaserbyintensitycorrelationmeasurementofxrayfluorescence AT osakataito focuscharacterizationofanxrayfreeelectronlaserbyintensitycorrelationmeasurementofxrayfluorescence AT yabashimakina focuscharacterizationofanxrayfreeelectronlaserbyintensitycorrelationmeasurementofxrayfluorescence AT ishikawatetsuya focuscharacterizationofanxrayfreeelectronlaserbyintensitycorrelationmeasurementofxrayfluorescence AT yamauchikazuto focuscharacterizationofanxrayfreeelectronlaserbyintensitycorrelationmeasurementofxrayfluorescence |