Reflectance in AFM-IR: Implications for Interpretation and Remote Analysis of the Buried Interface

[Image: see text] AFM-IR combines the chemical sensitivity of infrared spectroscopy with the lateral resolution of scanning probe microscopy, allowing nanoscale chemical analysis of almost any organic material under ambient conditions. As a result, this versatile technique is rapidly gaining popular...

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Detalles Bibliográficos
Autores principales: Morsch, Suzanne, Lyon, Stuart, Edmondson, Steve, Gibbon, Simon
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2020
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7467426/
https://www.ncbi.nlm.nih.gov/pubmed/32412736
http://dx.doi.org/10.1021/acs.analchem.9b05793

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7467426/
https://www.ncbi.nlm.nih.gov/pubmed/32412736
http://dx.doi.org/10.1021/acs.analchem.9b05793

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