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Reflectance in AFM-IR: Implications for Interpretation and Remote Analysis of the Buried Interface
[Image: see text] AFM-IR combines the chemical sensitivity of infrared spectroscopy with the lateral resolution of scanning probe microscopy, allowing nanoscale chemical analysis of almost any organic material under ambient conditions. As a result, this versatile technique is rapidly gaining popular...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
American Chemical
Society
2020
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7467426/ https://www.ncbi.nlm.nih.gov/pubmed/32412736 http://dx.doi.org/10.1021/acs.analchem.9b05793 |