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Rapid Photonic Processing of High-Electron-Mobility PbS Colloidal Quantum Dot Transistors
[Image: see text] Recent advances in solution-processable semiconducting colloidal quantum dots (CQDs) have enabled their use in a range of (opto)electronic devices. In most of these studies, device fabrication relied almost exclusively on thermal annealing to remove organic residues and enhance int...
Autores principales: | , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
American
Chemical Society
2020
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7467567/ https://www.ncbi.nlm.nih.gov/pubmed/32564590 http://dx.doi.org/10.1021/acsami.0c06306 |
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author | Nugraha, Mohamad I. Yarali, Emre Firdaus, Yuliar Lin, Yuanbao El-Labban, Abdulrahman Gedda, Murali Lidorikis, Elefterios Yengel, Emre Faber, Hendrik Anthopoulos, Thomas D. |
author_facet | Nugraha, Mohamad I. Yarali, Emre Firdaus, Yuliar Lin, Yuanbao El-Labban, Abdulrahman Gedda, Murali Lidorikis, Elefterios Yengel, Emre Faber, Hendrik Anthopoulos, Thomas D. |
author_sort | Nugraha, Mohamad I. |
collection | PubMed |
description | [Image: see text] Recent advances in solution-processable semiconducting colloidal quantum dots (CQDs) have enabled their use in a range of (opto)electronic devices. In most of these studies, device fabrication relied almost exclusively on thermal annealing to remove organic residues and enhance inter-CQD electronic coupling. Despite its widespread use, however, thermal annealing is a lengthy process, while its effectiveness to eliminate organic residues remains limited. Here, we exploit the use of xenon flash lamp sintering to post-treat solution-deposited layers of lead sulfide (PbS) CQDs and their application in n-channel thin-film transistors (TFTs). The process is simple, fast, and highly scalable and allows for efficient removal of organic residues while preserving both quantum confinement and high channel current modulation. Bottom-gate, top-contact PbS CQD TFTs incorporating SiO(2) as the gate dielectric exhibit a maximum electron mobility of 0.2 cm(2) V(–1) s(–1), a value higher than that of control transistors (≈10(–2) cm(2) V(–1) s(–1)) processed via thermal annealing for 30 min at 120 °C. Replacing SiO(2) with a polymeric dielectric improves the transistor’s channel interface, leading to a significant increase in electron mobility to 3.7 cm(2) V(–1) s(–1). The present work highlights the potential of flash lamp annealing as a promising method for the rapid manufacture of PbS CQD-based (opto)electronic devices and circuits. |
format | Online Article Text |
id | pubmed-7467567 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | American
Chemical Society |
record_format | MEDLINE/PubMed |
spelling | pubmed-74675672020-09-03 Rapid Photonic Processing of High-Electron-Mobility PbS Colloidal Quantum Dot Transistors Nugraha, Mohamad I. Yarali, Emre Firdaus, Yuliar Lin, Yuanbao El-Labban, Abdulrahman Gedda, Murali Lidorikis, Elefterios Yengel, Emre Faber, Hendrik Anthopoulos, Thomas D. ACS Appl Mater Interfaces [Image: see text] Recent advances in solution-processable semiconducting colloidal quantum dots (CQDs) have enabled their use in a range of (opto)electronic devices. In most of these studies, device fabrication relied almost exclusively on thermal annealing to remove organic residues and enhance inter-CQD electronic coupling. Despite its widespread use, however, thermal annealing is a lengthy process, while its effectiveness to eliminate organic residues remains limited. Here, we exploit the use of xenon flash lamp sintering to post-treat solution-deposited layers of lead sulfide (PbS) CQDs and their application in n-channel thin-film transistors (TFTs). The process is simple, fast, and highly scalable and allows for efficient removal of organic residues while preserving both quantum confinement and high channel current modulation. Bottom-gate, top-contact PbS CQD TFTs incorporating SiO(2) as the gate dielectric exhibit a maximum electron mobility of 0.2 cm(2) V(–1) s(–1), a value higher than that of control transistors (≈10(–2) cm(2) V(–1) s(–1)) processed via thermal annealing for 30 min at 120 °C. Replacing SiO(2) with a polymeric dielectric improves the transistor’s channel interface, leading to a significant increase in electron mobility to 3.7 cm(2) V(–1) s(–1). The present work highlights the potential of flash lamp annealing as a promising method for the rapid manufacture of PbS CQD-based (opto)electronic devices and circuits. American Chemical Society 2020-06-22 2020-07-15 /pmc/articles/PMC7467567/ /pubmed/32564590 http://dx.doi.org/10.1021/acsami.0c06306 Text en Copyright © 2020 American Chemical Society This is an open access article published under a Creative Commons Attribution (CC-BY) License (http://pubs.acs.org/page/policy/authorchoice_ccby_termsofuse.html) , which permits unrestricted use, distribution and reproduction in any medium, provided the author and source are cited. |
spellingShingle | Nugraha, Mohamad I. Yarali, Emre Firdaus, Yuliar Lin, Yuanbao El-Labban, Abdulrahman Gedda, Murali Lidorikis, Elefterios Yengel, Emre Faber, Hendrik Anthopoulos, Thomas D. Rapid Photonic Processing of High-Electron-Mobility PbS Colloidal Quantum Dot Transistors |
title | Rapid
Photonic Processing of High-Electron-Mobility PbS Colloidal Quantum
Dot Transistors |
title_full | Rapid
Photonic Processing of High-Electron-Mobility PbS Colloidal Quantum
Dot Transistors |
title_fullStr | Rapid
Photonic Processing of High-Electron-Mobility PbS Colloidal Quantum
Dot Transistors |
title_full_unstemmed | Rapid
Photonic Processing of High-Electron-Mobility PbS Colloidal Quantum
Dot Transistors |
title_short | Rapid
Photonic Processing of High-Electron-Mobility PbS Colloidal Quantum
Dot Transistors |
title_sort | rapid
photonic processing of high-electron-mobility pbs colloidal quantum
dot transistors |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7467567/ https://www.ncbi.nlm.nih.gov/pubmed/32564590 http://dx.doi.org/10.1021/acsami.0c06306 |
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