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On the reliability of highly magnified micrographs for structural analysis in materials science

Highly magnified micrographs are part of the majority of publications in materials science and related fields. They are often the basis for discussions and far-reaching conclusions on the nature of the specimen. In many cases, reviewers demand and researchers deliver only the bare minimum of microgr...

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Autores principales: Wortmann, Martin, Layland, Ashley Stephen, Frese, Natalie, Kahmann, Uwe, Grothe, Timo, Storck, Jan Lukas, Blachowicz, Tomasz, Grzybowski, Jacek, Hüsgen, Bruno, Ehrmann, Andrea
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7477546/
https://www.ncbi.nlm.nih.gov/pubmed/32895411
http://dx.doi.org/10.1038/s41598-020-71682-8
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author Wortmann, Martin
Layland, Ashley Stephen
Frese, Natalie
Kahmann, Uwe
Grothe, Timo
Storck, Jan Lukas
Blachowicz, Tomasz
Grzybowski, Jacek
Hüsgen, Bruno
Ehrmann, Andrea
author_facet Wortmann, Martin
Layland, Ashley Stephen
Frese, Natalie
Kahmann, Uwe
Grothe, Timo
Storck, Jan Lukas
Blachowicz, Tomasz
Grzybowski, Jacek
Hüsgen, Bruno
Ehrmann, Andrea
author_sort Wortmann, Martin
collection PubMed
description Highly magnified micrographs are part of the majority of publications in materials science and related fields. They are often the basis for discussions and far-reaching conclusions on the nature of the specimen. In many cases, reviewers demand and researchers deliver only the bare minimum of micrographs to substantiate the research hypothesis at hand. In this work, we use heterogeneous poly(acrylonitrile) nanofiber nonwovens with embedded nanoparticles to demonstrate how an insufficient or biased micrograph selection may lead to erroneous conclusions. Different micrographs taken by transmission electron microscopy and helium ion microscopy with sometimes contradictory implications were analyzed and used as a basis for micromagnetic simulations. With this, we try to raise awareness for the possible consequences of cherry-picking for the reliability of scientific literature.
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spelling pubmed-74775462020-09-08 On the reliability of highly magnified micrographs for structural analysis in materials science Wortmann, Martin Layland, Ashley Stephen Frese, Natalie Kahmann, Uwe Grothe, Timo Storck, Jan Lukas Blachowicz, Tomasz Grzybowski, Jacek Hüsgen, Bruno Ehrmann, Andrea Sci Rep Article Highly magnified micrographs are part of the majority of publications in materials science and related fields. They are often the basis for discussions and far-reaching conclusions on the nature of the specimen. In many cases, reviewers demand and researchers deliver only the bare minimum of micrographs to substantiate the research hypothesis at hand. In this work, we use heterogeneous poly(acrylonitrile) nanofiber nonwovens with embedded nanoparticles to demonstrate how an insufficient or biased micrograph selection may lead to erroneous conclusions. Different micrographs taken by transmission electron microscopy and helium ion microscopy with sometimes contradictory implications were analyzed and used as a basis for micromagnetic simulations. With this, we try to raise awareness for the possible consequences of cherry-picking for the reliability of scientific literature. Nature Publishing Group UK 2020-09-07 /pmc/articles/PMC7477546/ /pubmed/32895411 http://dx.doi.org/10.1038/s41598-020-71682-8 Text en © The Author(s) 2020 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Wortmann, Martin
Layland, Ashley Stephen
Frese, Natalie
Kahmann, Uwe
Grothe, Timo
Storck, Jan Lukas
Blachowicz, Tomasz
Grzybowski, Jacek
Hüsgen, Bruno
Ehrmann, Andrea
On the reliability of highly magnified micrographs for structural analysis in materials science
title On the reliability of highly magnified micrographs for structural analysis in materials science
title_full On the reliability of highly magnified micrographs for structural analysis in materials science
title_fullStr On the reliability of highly magnified micrographs for structural analysis in materials science
title_full_unstemmed On the reliability of highly magnified micrographs for structural analysis in materials science
title_short On the reliability of highly magnified micrographs for structural analysis in materials science
title_sort on the reliability of highly magnified micrographs for structural analysis in materials science
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7477546/
https://www.ncbi.nlm.nih.gov/pubmed/32895411
http://dx.doi.org/10.1038/s41598-020-71682-8
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