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Atomic defect classification of the H–Si(100) surface through multi-mode scanning probe microscopy

The combination of scanning tunnelling microscopy (STM) and non-contact atomic force microscopy (nc-AFM) allows enhanced extraction and correlation of properties not readily available via a single imaging mode. We demonstrate this through the characterization and classification of several commonly f...

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Detalles Bibliográficos
Autores principales:	Croshaw, Jeremiah, Dienel, Thomas, Huff, Taleana, Wolkow, Robert
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Beilstein-Institut 2020
Materias:	Full Research Paper
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7492692/ https://www.ncbi.nlm.nih.gov/pubmed/32974113 http://dx.doi.org/10.3762/bjnano.11.119

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