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Mechanical Properties and Corrosion Resistance of NbTiAlSiZrN(x) High-Entropy Films Prepared by RF Magnetron Sputtering

In this study, we designed and fabricated NbTiAlSiZrN(x) high-entropy alloy (HEA) films. The parameters of the radio frequency (RF) pulse magnetron sputtering process were fixed to maintain the N(2) flux ratio at 0%, 10%, 20%, 30%, 40%, and 50%. Subsequently, NbTiAlSiZrN(x) HEA films were deposited...

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Detalles Bibliográficos
Autores principales: Xing, Qiuwei, Wang, Haijiang, Chen, Mingbiao, Chen, Zhaoyun, Li, Rongbin, Jin, Peipeng, Zhang, Yong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7514885/
https://www.ncbi.nlm.nih.gov/pubmed/33267110
http://dx.doi.org/10.3390/e21040396
Descripción
Sumario:In this study, we designed and fabricated NbTiAlSiZrN(x) high-entropy alloy (HEA) films. The parameters of the radio frequency (RF) pulse magnetron sputtering process were fixed to maintain the N(2) flux ratio at 0%, 10%, 20%, 30%, 40%, and 50%. Subsequently, NbTiAlSiZrN(x) HEA films were deposited on the 304 stainless steel (SS) substrate. With an increasing N(2) flow rate, the film deposited at a R(N) of 50% had the highest hardness (12.4 GPa), the highest modulus (169 GPa), a small roughness, and a beautiful color. The thicknesses of the films were gradually reduced from 298.8 nm to 200 nm, and all the thin films were of amorphous structure. The electrochemical corrosion resistance of the film in a 0.5 mol/L H(2)SO(4) solution at room temperature was studied and the characteristics changed. The HEA films prepared at N(2) flow rates of 10% and 30% were more prone to corrosion than 304 SS, but the corrosion rate was lower than that of 304 SS. NbTiAlSiZrN(x) HEA films prepared at N(2) flow rates of 20%, 40%, and 50% were more corrosion-resistant than 304 SS. In addition, the passivation stability of the NbTiAlSiZrN(x) HEA was worse than that of 304 SS. Altogether, these results show that pitting corrosion occurred on NbTiAlSiZrN(x) HEA films.