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Influence of Co concentration on properties of NiO film by sparking under uniform magnetic field
Nickel oxide (NiO) films cover numerous electronic applications, including transparent conducting oxides and hole transport layer, because of its high transparency and wide band gap. A sparking discharge is a new and unique method for the deposition of NiO films due to non-complex operation and non-...
Autores principales: | , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7515867/ https://www.ncbi.nlm.nih.gov/pubmed/32973228 http://dx.doi.org/10.1038/s41598-020-72883-x |
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author | Tippo, Posak Thongsuwan, Wiradej Wiranwetchayan, Orawan Kumpika, Tewasin Kantarak, Ekkapong Singjai, Pisith |
author_facet | Tippo, Posak Thongsuwan, Wiradej Wiranwetchayan, Orawan Kumpika, Tewasin Kantarak, Ekkapong Singjai, Pisith |
author_sort | Tippo, Posak |
collection | PubMed |
description | Nickel oxide (NiO) films cover numerous electronic applications, including transparent conducting oxides and hole transport layer, because of its high transparency and wide band gap. A sparking discharge is a new and unique method for the deposition of NiO films due to non-complex operation and non-requirement of a vacuum atmosphere. Unfortunately, NiO films by the sparking method display a porous surface with inferior crystallinity. By assisting a uniform magnetic field in the sparking method, the porous and the crystallinity of NiO are improved. However, electrical properties of the NiO films deposited by this strategy are poor. In order to improve the electrical properties of NiO, a substitutional of Ni ions by Co ions is considered. In this study, we report an influence of Co concentration on properties of NiO films by sparking under a uniform magnetic field. Our results indicate that an increase in Co concentration to 0.1 M improves the crystallinity and increases a carrier concentration of NiO, resulting in a reduction of the resistivity. This consequence is in agreement with the increase in a number of higher-valence Ni(3+) because of the Co(2+) substituted Ni(2+). Based on our research, Co-NiO film is promising materials for a transparent conductor. |
format | Online Article Text |
id | pubmed-7515867 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-75158672020-09-29 Influence of Co concentration on properties of NiO film by sparking under uniform magnetic field Tippo, Posak Thongsuwan, Wiradej Wiranwetchayan, Orawan Kumpika, Tewasin Kantarak, Ekkapong Singjai, Pisith Sci Rep Article Nickel oxide (NiO) films cover numerous electronic applications, including transparent conducting oxides and hole transport layer, because of its high transparency and wide band gap. A sparking discharge is a new and unique method for the deposition of NiO films due to non-complex operation and non-requirement of a vacuum atmosphere. Unfortunately, NiO films by the sparking method display a porous surface with inferior crystallinity. By assisting a uniform magnetic field in the sparking method, the porous and the crystallinity of NiO are improved. However, electrical properties of the NiO films deposited by this strategy are poor. In order to improve the electrical properties of NiO, a substitutional of Ni ions by Co ions is considered. In this study, we report an influence of Co concentration on properties of NiO films by sparking under a uniform magnetic field. Our results indicate that an increase in Co concentration to 0.1 M improves the crystallinity and increases a carrier concentration of NiO, resulting in a reduction of the resistivity. This consequence is in agreement with the increase in a number of higher-valence Ni(3+) because of the Co(2+) substituted Ni(2+). Based on our research, Co-NiO film is promising materials for a transparent conductor. Nature Publishing Group UK 2020-09-24 /pmc/articles/PMC7515867/ /pubmed/32973228 http://dx.doi.org/10.1038/s41598-020-72883-x Text en © The Author(s) 2020 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/. |
spellingShingle | Article Tippo, Posak Thongsuwan, Wiradej Wiranwetchayan, Orawan Kumpika, Tewasin Kantarak, Ekkapong Singjai, Pisith Influence of Co concentration on properties of NiO film by sparking under uniform magnetic field |
title | Influence of Co concentration on properties of NiO film by sparking under uniform magnetic field |
title_full | Influence of Co concentration on properties of NiO film by sparking under uniform magnetic field |
title_fullStr | Influence of Co concentration on properties of NiO film by sparking under uniform magnetic field |
title_full_unstemmed | Influence of Co concentration on properties of NiO film by sparking under uniform magnetic field |
title_short | Influence of Co concentration on properties of NiO film by sparking under uniform magnetic field |
title_sort | influence of co concentration on properties of nio film by sparking under uniform magnetic field |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7515867/ https://www.ncbi.nlm.nih.gov/pubmed/32973228 http://dx.doi.org/10.1038/s41598-020-72883-x |
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