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Wafer-level integration of self-aligned high aspect ratio silicon 3D structures using the MACE method with Au, Pd, Pt, Cu, and Ir
The wafer-level integration of high aspect ratio silicon nanostructures is an essential part of the fabrication of nanodevices. Metal-assisted chemical etching (MACE) is a promising low-cost and high-volume technique for the generation of vertically aligned silicon nanowires. Noble metal nanoparticl...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Beilstein-Institut
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7522463/ https://www.ncbi.nlm.nih.gov/pubmed/33029473 http://dx.doi.org/10.3762/bjnano.11.128 |
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author | Franz, Mathias Junghans, Romy Schmitt, Paul Szeghalmi, Adriana Schulz, Stefan E |
author_facet | Franz, Mathias Junghans, Romy Schmitt, Paul Szeghalmi, Adriana Schulz, Stefan E |
author_sort | Franz, Mathias |
collection | PubMed |
description | The wafer-level integration of high aspect ratio silicon nanostructures is an essential part of the fabrication of nanodevices. Metal-assisted chemical etching (MACE) is a promising low-cost and high-volume technique for the generation of vertically aligned silicon nanowires. Noble metal nanoparticles were used to locally etch the silicon substrate. This work demonstrates a bottom-up self-assembly approach for noble metal nanoparticle formation and the subsequent silicon wet etching. The macroscopic wafer patterning has been done by using a poly(methyl methacrylate) masking layer. Different metals (Au, Pt, Pd, Cu, and Ir) were investigated to derive a set of technologies as platform for specific applications. Especially, the shape of the 3D structures and the resulting reflectance have been investigated. The Si nanostructures fabricated using Au nanoparticles show a perfect light absorption with a reflectance below 0.3%. The demonstrated technology can be integrated into common fabrication processes for microelectromechanical systems. |
format | Online Article Text |
id | pubmed-7522463 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | Beilstein-Institut |
record_format | MEDLINE/PubMed |
spelling | pubmed-75224632020-10-06 Wafer-level integration of self-aligned high aspect ratio silicon 3D structures using the MACE method with Au, Pd, Pt, Cu, and Ir Franz, Mathias Junghans, Romy Schmitt, Paul Szeghalmi, Adriana Schulz, Stefan E Beilstein J Nanotechnol Full Research Paper The wafer-level integration of high aspect ratio silicon nanostructures is an essential part of the fabrication of nanodevices. Metal-assisted chemical etching (MACE) is a promising low-cost and high-volume technique for the generation of vertically aligned silicon nanowires. Noble metal nanoparticles were used to locally etch the silicon substrate. This work demonstrates a bottom-up self-assembly approach for noble metal nanoparticle formation and the subsequent silicon wet etching. The macroscopic wafer patterning has been done by using a poly(methyl methacrylate) masking layer. Different metals (Au, Pt, Pd, Cu, and Ir) were investigated to derive a set of technologies as platform for specific applications. Especially, the shape of the 3D structures and the resulting reflectance have been investigated. The Si nanostructures fabricated using Au nanoparticles show a perfect light absorption with a reflectance below 0.3%. The demonstrated technology can be integrated into common fabrication processes for microelectromechanical systems. Beilstein-Institut 2020-09-23 /pmc/articles/PMC7522463/ /pubmed/33029473 http://dx.doi.org/10.3762/bjnano.11.128 Text en Copyright © 2020, Franz et al. https://creativecommons.org/licenses/by/4.0https://www.beilstein-journals.org/bjnano/termsThis is an Open Access article under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/4.0). Please note that the reuse, redistribution and reproduction in particular requires that the authors and source are credited. The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (https://www.beilstein-journals.org/bjnano/terms) |
spellingShingle | Full Research Paper Franz, Mathias Junghans, Romy Schmitt, Paul Szeghalmi, Adriana Schulz, Stefan E Wafer-level integration of self-aligned high aspect ratio silicon 3D structures using the MACE method with Au, Pd, Pt, Cu, and Ir |
title | Wafer-level integration of self-aligned high aspect ratio silicon 3D structures using the MACE method with Au, Pd, Pt, Cu, and Ir |
title_full | Wafer-level integration of self-aligned high aspect ratio silicon 3D structures using the MACE method with Au, Pd, Pt, Cu, and Ir |
title_fullStr | Wafer-level integration of self-aligned high aspect ratio silicon 3D structures using the MACE method with Au, Pd, Pt, Cu, and Ir |
title_full_unstemmed | Wafer-level integration of self-aligned high aspect ratio silicon 3D structures using the MACE method with Au, Pd, Pt, Cu, and Ir |
title_short | Wafer-level integration of self-aligned high aspect ratio silicon 3D structures using the MACE method with Au, Pd, Pt, Cu, and Ir |
title_sort | wafer-level integration of self-aligned high aspect ratio silicon 3d structures using the mace method with au, pd, pt, cu, and ir |
topic | Full Research Paper |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7522463/ https://www.ncbi.nlm.nih.gov/pubmed/33029473 http://dx.doi.org/10.3762/bjnano.11.128 |
work_keys_str_mv | AT franzmathias waferlevelintegrationofselfalignedhighaspectratiosilicon3dstructuresusingthemacemethodwithaupdptcuandir AT junghansromy waferlevelintegrationofselfalignedhighaspectratiosilicon3dstructuresusingthemacemethodwithaupdptcuandir AT schmittpaul waferlevelintegrationofselfalignedhighaspectratiosilicon3dstructuresusingthemacemethodwithaupdptcuandir AT szeghalmiadriana waferlevelintegrationofselfalignedhighaspectratiosilicon3dstructuresusingthemacemethodwithaupdptcuandir AT schulzstefane waferlevelintegrationofselfalignedhighaspectratiosilicon3dstructuresusingthemacemethodwithaupdptcuandir |