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Visualization and Chemical Characterization of the Cathode Electrolyte Interphase Using He-Ion Microscopy and In Situ Time-of-Flight Secondary Ion Mass Spectrometry

[Image: see text] Unstable cathode electrolyte interphase (CEI) formation increases degradation in high voltage Li-ion battery materials. Few techniques couple characterization of nano-scale CEI layers on the macroscale with in situ chemical characterization, and thus, information on how the underly...

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Autores principales: Wheatcroft, Laura, Klingner, Nico, Heller, René, Hlawacek, Gregor, Özkaya, Doğan, Cookson, James, Inkson, Beverley J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2020
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7525808/
https://www.ncbi.nlm.nih.gov/pubmed/33015588
http://dx.doi.org/10.1021/acsaem.0c01333
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author Wheatcroft, Laura
Klingner, Nico
Heller, René
Hlawacek, Gregor
Özkaya, Doğan
Cookson, James
Inkson, Beverley J.
author_facet Wheatcroft, Laura
Klingner, Nico
Heller, René
Hlawacek, Gregor
Özkaya, Doğan
Cookson, James
Inkson, Beverley J.
author_sort Wheatcroft, Laura
collection PubMed
description [Image: see text] Unstable cathode electrolyte interphase (CEI) formation increases degradation in high voltage Li-ion battery materials. Few techniques couple characterization of nano-scale CEI layers on the macroscale with in situ chemical characterization, and thus, information on how the underlying microstructure affects CEI formation is lost. Here, the process of CEI formation in a high voltage cathode material, LiCoPO(4), has been investigated for the first time using helium ion microscopy (HIM) and in situ time-of-flight (ToF) secondary ion mass spectrometry (SIMS). The combination of HIM and Ne-ion ToF-SIMS has been used to correlate the cycle-dependent morphology of the CEI layer on LiCoPO(4) with a local cathode microstructure, including position, thickness, and chemistry. HIM imaging identified partial dissolution of the CEI layer on discharge resulting in in-homogenous CEI coverage on larger LiCoPO(4) agglomerates. Ne-ion ToF-SIMS characterization identified oxyfluorophosphates from HF attack by the electrolyte and a Li-rich surface region. Variable thickness of the CEI layer coupled with inactive Li on the surface of LiCoPO(4) electrodes contributes to severe degradation over the course of 10 cycles. The HIM–SIMS technique has potential to further investigate the effect of microstructures on CEI formation in cathode materials or solid electrolyte interphase formation in anodes, thus aiding future electrode development.
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spelling pubmed-75258082020-10-01 Visualization and Chemical Characterization of the Cathode Electrolyte Interphase Using He-Ion Microscopy and In Situ Time-of-Flight Secondary Ion Mass Spectrometry Wheatcroft, Laura Klingner, Nico Heller, René Hlawacek, Gregor Özkaya, Doğan Cookson, James Inkson, Beverley J. ACS Appl Energy Mater [Image: see text] Unstable cathode electrolyte interphase (CEI) formation increases degradation in high voltage Li-ion battery materials. Few techniques couple characterization of nano-scale CEI layers on the macroscale with in situ chemical characterization, and thus, information on how the underlying microstructure affects CEI formation is lost. Here, the process of CEI formation in a high voltage cathode material, LiCoPO(4), has been investigated for the first time using helium ion microscopy (HIM) and in situ time-of-flight (ToF) secondary ion mass spectrometry (SIMS). The combination of HIM and Ne-ion ToF-SIMS has been used to correlate the cycle-dependent morphology of the CEI layer on LiCoPO(4) with a local cathode microstructure, including position, thickness, and chemistry. HIM imaging identified partial dissolution of the CEI layer on discharge resulting in in-homogenous CEI coverage on larger LiCoPO(4) agglomerates. Ne-ion ToF-SIMS characterization identified oxyfluorophosphates from HF attack by the electrolyte and a Li-rich surface region. Variable thickness of the CEI layer coupled with inactive Li on the surface of LiCoPO(4) electrodes contributes to severe degradation over the course of 10 cycles. The HIM–SIMS technique has potential to further investigate the effect of microstructures on CEI formation in cathode materials or solid electrolyte interphase formation in anodes, thus aiding future electrode development. American Chemical Society 2020-08-25 2020-09-28 /pmc/articles/PMC7525808/ /pubmed/33015588 http://dx.doi.org/10.1021/acsaem.0c01333 Text en Copyright © 2020 American Chemical Society This is an open access article published under a Creative Commons Attribution (CC-BY) License (http://pubs.acs.org/page/policy/authorchoice_ccby_termsofuse.html) , which permits unrestricted use, distribution and reproduction in any medium, provided the author and source are cited.
spellingShingle Wheatcroft, Laura
Klingner, Nico
Heller, René
Hlawacek, Gregor
Özkaya, Doğan
Cookson, James
Inkson, Beverley J.
Visualization and Chemical Characterization of the Cathode Electrolyte Interphase Using He-Ion Microscopy and In Situ Time-of-Flight Secondary Ion Mass Spectrometry
title Visualization and Chemical Characterization of the Cathode Electrolyte Interphase Using He-Ion Microscopy and In Situ Time-of-Flight Secondary Ion Mass Spectrometry
title_full Visualization and Chemical Characterization of the Cathode Electrolyte Interphase Using He-Ion Microscopy and In Situ Time-of-Flight Secondary Ion Mass Spectrometry
title_fullStr Visualization and Chemical Characterization of the Cathode Electrolyte Interphase Using He-Ion Microscopy and In Situ Time-of-Flight Secondary Ion Mass Spectrometry
title_full_unstemmed Visualization and Chemical Characterization of the Cathode Electrolyte Interphase Using He-Ion Microscopy and In Situ Time-of-Flight Secondary Ion Mass Spectrometry
title_short Visualization and Chemical Characterization of the Cathode Electrolyte Interphase Using He-Ion Microscopy and In Situ Time-of-Flight Secondary Ion Mass Spectrometry
title_sort visualization and chemical characterization of the cathode electrolyte interphase using he-ion microscopy and in situ time-of-flight secondary ion mass spectrometry
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7525808/
https://www.ncbi.nlm.nih.gov/pubmed/33015588
http://dx.doi.org/10.1021/acsaem.0c01333
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