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Thermal neutron transmutation doping of GaN semiconductors

High quality Ge doping of GaN is demonstrated using primarily thermal neutrons for the first time. In this study, GaN was doped with Ge to concentrations from 10(16) Ge atoms/cm(3) to 10(18) Ge atoms/cm(3). The doping concentrations were measured using gamma-ray spectroscopy and confirmed using SIMS...

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Detalles Bibliográficos
Autores principales: Barber, R., Nguyen, Q., Brockman, J., Gahl, J., Kwon, J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7530752/
https://www.ncbi.nlm.nih.gov/pubmed/33004847
http://dx.doi.org/10.1038/s41598-020-72862-2