Grazing-incidence X-ray diffraction investigation of the coincidence site lattice of the Ge/Si(001) system

The Ge/Si(001) system has been analysed by grazing-incidence X-ray diffraction on a standard laboratory X-ray diffraction tool. A periodic array of interfacial edge dislocations forms a coincidence site lattice (CSL) which yields equidistantly spaced satellite peaks close to Bragg peaks of the Ge la...

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Detalles Bibliográficos
Autores principales: Barnscheidt, Yvo, Schmidt, Jan, Osten, H. Jörg
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2020
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7534540/
https://www.ncbi.nlm.nih.gov/pubmed/33117108
http://dx.doi.org/10.1107/S1600576720009255

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7534540/
https://www.ncbi.nlm.nih.gov/pubmed/33117108
http://dx.doi.org/10.1107/S1600576720009255

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