Cargando…

Grazing-incidence X-ray diffraction investigation of the coincidence site lattice of the Ge/Si(001) system

The Ge/Si(001) system has been analysed by grazing-incidence X-ray diffraction on a standard laboratory X-ray diffraction tool. A periodic array of interfacial edge dislocations forms a coincidence site lattice (CSL) which yields equidistantly spaced satellite peaks close to Bragg peaks of the Ge la...

Descripción completa

Detalles Bibliográficos
Autores principales:	Barnscheidt, Yvo, Schmidt, Jan, Osten, H. Jörg
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	International Union of Crystallography 2020
Materias:	Research Papers
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7534540/ https://www.ncbi.nlm.nih.gov/pubmed/33117108 http://dx.doi.org/10.1107/S1600576720009255

Ejemplares similares

Indexing grazing-incidence X-ray diffraction patterns of thin films: lattices of higher symmetry
por: Simbrunner, Josef, et al.
Publicado: (2019)

Multiple scattering in grazing-incidence X-ray diffraction: impact on lattice-constant determination in thin films
por: Resel, Roland, et al.
Publicado: (2016)

Grazing-incidence X-ray diffraction tomography for characterizing organic thin films
por: Tsai, Esther H. R., et al.
Publicado: (2021)

GIDInd: an automated indexing software for grazing-incidence X-ray diffraction data
por: Kainz, Manuel Peter, et al.
Publicado: (2021)

Spot profile analysis and lifetime mapping in ultrafast electron diffraction: Lattice excitation of self-organized Ge nanostructures on Si(001)
por: Frigge, T., et al.
Publicado: (2015)

Surface quality inspection of PbWO$_{4}$ crystals by grazing incidence X-ray diffraction
por: Mengucci, P, et al.
Publicado: (2005)

Indexing of grazing-incidence X-ray diffraction patterns: the case of fibre-textured thin films
por: Simbrunner, Josef, et al.
Publicado: (2018)

Capabilities of Grazing Incidence X-ray Diffraction in the Investigation of Amorphous Mixed Oxides with Variable Composition
por: Achilli, Elisabetta, et al.
Publicado: (2022)

Grazing-incidence small-angle X-ray scattering: application to the study of quantum dot lattices
por: Buljan, Maja, et al.
Publicado: (2012)

Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams
por: Bussone, Genziana, et al.
Publicado: (2013)

Damage thresholds for blaze diffraction gratings and grazing incidence optics at an X-ray free-electron laser
por: Krzywinski, Jacek, et al.
Publicado: (2018)

Grazing Incidence X-ray Diffraction Studies of Lipid–Peptide Mixed Monolayers during Shear Flow
por: Bera, Pradip K., et al.
Publicado: (2020)

An efficient method for indexing grazing-incidence X-ray diffraction data of epitaxially grown thin films
por: Simbrunner, Josef, et al.
Publicado: (2020)

Density dependent composition of InAs quantum dots extracted from grazing incidence x-ray diffraction measurements
por: Sharma, Manjula, et al.
Publicado: (2015)

Temperature dependent photoelectron diffraction of the Si(001) surface
por: Fraxedas, J, et al.
Publicado: (1994)

Atomic Scale Formation Mechanism of Edge Dislocation Relieving Lattice Strain in a GeSi overlayer on Si(001)
por: Maras, E., et al.
Publicado: (2017)

Application of Grazing-Incidence X-ray Methods to Study Terrace-Stepped SiC Surface for Graphene Growth
por: Roschin, Boris S., et al.
Publicado: (2022)

Ultrafast lattice response of photoexcited thin films studied by X-ray diffraction
por: Schick, Daniel, et al.
Publicado: (2014)

Automated prediction of lattice parameters from X-ray powder diffraction patterns
por: Chitturi, Sathya R., et al.
Publicado: (2021)

Communication: The formation of rarefaction waves in semiconductors after ultrashort excitation probed by grazing incidence ultrafast time-resolved x-ray diffraction
por: Höfer, S., et al.
Publicado: (2016)

GIDVis: a comprehensive software tool for geometry-independent grazing-incidence X-ray diffraction data analysis and pole-figure calculations
por: Schrode, Benedikt, et al.
Publicado: (2019)

Surface Induced Phenytoin Polymorph. 1. Full Structure Solution by Combining Grazing Incidence X-ray Diffraction and Crystal Structure Prediction
por: Braun, Doris E., et al.
Publicado: (2019)

Characterization of surface and subsurface defects induced by abrasive machining of optical crystals using grazing incidence X-ray diffraction and molecular dynamics
por: Zhang, Yong, et al.
Publicado: (2021)

Grazing-incidence small-angle X-ray scattering study of correlated lateral density fluctuations in W/Si multilayers
por: Nikolaev, K. V., et al.
Publicado: (2019)

Characterization of High-k Nanolayers by Grazing Incidence X-ray Spectrometry
por: Müller, Matthias, et al.
Publicado: (2014)

Development of a versatile electrochemical cell for in situ grazing-incidence X-ray diffraction during non-aqueous electrochemical nitrogen reduction
por: Blair, Sarah J., et al.
Publicado: (2023)

Blocked melting of the Si(001) surface: a photoelectron diffraction study
por: Fraxedas, J, et al.
Publicado: (1993)

Ordered GeSi nanorings grown on patterned Si (001) substrates
por: Ma, Yingjie, et al.
Publicado: (2011)

Epitaxial Growth of Ordered In-Plane Si and Ge Nanowires on Si (001)
por: Wang, Jian-Huan, et al.
Publicado: (2021)

Formation of GeO(2) under Graphene on Ge(001)/Si(001) Substrates Using Water Vapor
por: Dumiszewska, Ewa, et al.
Publicado: (2022)

Nanofocusing of X-ray free-electron lasers by grazing-incidence reflective optics
por: Yamauchi, Kazuto, et al.
Publicado: (2015)

Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics
por: Gorfman, S., et al.
Publicado: (2016)

Extensive Broadband Near-Infrared Emissions from Ge(x)Si(1−x) Alloys on Micro-Hole Patterned Si(001) Substrates
por: Peng, Kun, et al.
Publicado: (2021)

Understanding the growth mechanism of graphene on Ge/Si(001) surfaces
por: Dabrowski, J., et al.
Publicado: (2016)

Alloying and Strain Relaxation in SiGe Islands Grown on Pit-Patterned Si(001) Substrates Probed by Nanotomography
por: Pezzoli, F, et al.
Publicado: (2009)

Elements of X-ray diffraction
por: Cullity, B D
Publicado: (1967)

Elements of x-ray diffraction
por: Cullity, B. D. (Bernard Dennis)
Publicado: (2001)

X-Ray Diffraction by Macromolecules
por: Kasai, Nobutami, et al.
Publicado: (2005)

Elements of X-ray diffraction
por: Cullity, B D, et al.
Publicado: (2001)

X-ray diffraction procedures
por: Klug, Harold P, et al.
Publicado: (1954)

Cannot write session to /tmp/vufind_sessions/sess_7ef5o85lmkc1muhr5mnjc75g7p