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Helium ion microscope – secondary ion mass spectrometry for geological materials

The helium ion microscope (HIM) is a focussed ion beam instrument with unprecedented spatial resolution for secondary electron imaging but has traditionally lacked microanalytical capabilities. With the addition of the secondary ion mass spectrometry (SIMS) attachment, the capabilities of the instru...

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Detalles Bibliográficos
Autores principales:	Ball, Matthew R, Taylor, Richard J M, Einsle, Joshua F, Khanom, Fouzia, Guillermier, Christelle, Harrison, Richard J
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Beilstein-Institut 2020
Materias:	Full Research Paper
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7537380/ https://www.ncbi.nlm.nih.gov/pubmed/33083198 http://dx.doi.org/10.3762/bjnano.11.133

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