Lock-in Ultrafast Electron Microscopy Simultaneously Visualizes Carrier Recombination and Interface-Mediated Trapping

[Image: see text] Visualizing charge carrier flow over interfaces or near surfaces meets great challenges concerning resolution and vastly different time scales of bulk and surface dynamics. Ultrafast or four-dimensional scanning electron microscopy (USEM) using a laser pump electron probe scheme ci...

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Detalles Bibliográficos
Autores principales: Garming, Mathijs W. H., Bolhuis, Maarten, Conesa-Boj, Sonia, Kruit, Pieter, Hoogenboom, Jacob P.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2020
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7569669/
https://www.ncbi.nlm.nih.gov/pubmed/32909435
http://dx.doi.org/10.1021/acs.jpclett.0c02345

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7569669/
https://www.ncbi.nlm.nih.gov/pubmed/32909435
http://dx.doi.org/10.1021/acs.jpclett.0c02345

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