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CMOS Fixed Pattern Noise Elimination Based on Sparse Unidirectional Hybrid Total Variation
With the improvement of semiconductor technology, the performance of CMOS Image Sensor has been greatly improved, reaching the same level as that of CCD in dark current, linearity and readout noise. However, due to the production process, CMOS has higher fix pattern noise than CCD at present. Theref...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2020
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7582543/ https://www.ncbi.nlm.nih.gov/pubmed/32998435 http://dx.doi.org/10.3390/s20195567 |