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Fixed Pattern Noise Reduction and Linearity Improvement in Time-Mode CMOS Image Sensors

In the paper, a digital clock stopping technique for gain and offset correction in time-mode analog-to-digital converters (ADCs) has been proposed. The technique is dedicated to imagers with massively parallel image acquisition working in the time mode where compensation of dark signal non-uniformit...

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Detalles Bibliográficos
Autores principales: Kłosowski, Miron, Sun, Yichuang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7588900/
https://www.ncbi.nlm.nih.gov/pubmed/33092284
http://dx.doi.org/10.3390/s20205921
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author Kłosowski, Miron
Sun, Yichuang
author_facet Kłosowski, Miron
Sun, Yichuang
author_sort Kłosowski, Miron
collection PubMed
description In the paper, a digital clock stopping technique for gain and offset correction in time-mode analog-to-digital converters (ADCs) has been proposed. The technique is dedicated to imagers with massively parallel image acquisition working in the time mode where compensation of dark signal non-uniformity (DSNU) as well as photo-response non-uniformity (PRNU) is critical. Fixed pattern noise (FPN) reduction has been experimentally validated using 128-pixel CMOS imager. The reduction of the PRNU to about 0.5 LSB has been achieved. Linearity improvement technique has also been proposed, which allows for integral nonlinearity (INL) reduction to about 0.5 LSB. Measurements confirm the proposed approach.
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spelling pubmed-75889002020-10-29 Fixed Pattern Noise Reduction and Linearity Improvement in Time-Mode CMOS Image Sensors Kłosowski, Miron Sun, Yichuang Sensors (Basel) Article In the paper, a digital clock stopping technique for gain and offset correction in time-mode analog-to-digital converters (ADCs) has been proposed. The technique is dedicated to imagers with massively parallel image acquisition working in the time mode where compensation of dark signal non-uniformity (DSNU) as well as photo-response non-uniformity (PRNU) is critical. Fixed pattern noise (FPN) reduction has been experimentally validated using 128-pixel CMOS imager. The reduction of the PRNU to about 0.5 LSB has been achieved. Linearity improvement technique has also been proposed, which allows for integral nonlinearity (INL) reduction to about 0.5 LSB. Measurements confirm the proposed approach. MDPI 2020-10-20 /pmc/articles/PMC7588900/ /pubmed/33092284 http://dx.doi.org/10.3390/s20205921 Text en © 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Kłosowski, Miron
Sun, Yichuang
Fixed Pattern Noise Reduction and Linearity Improvement in Time-Mode CMOS Image Sensors
title Fixed Pattern Noise Reduction and Linearity Improvement in Time-Mode CMOS Image Sensors
title_full Fixed Pattern Noise Reduction and Linearity Improvement in Time-Mode CMOS Image Sensors
title_fullStr Fixed Pattern Noise Reduction and Linearity Improvement in Time-Mode CMOS Image Sensors
title_full_unstemmed Fixed Pattern Noise Reduction and Linearity Improvement in Time-Mode CMOS Image Sensors
title_short Fixed Pattern Noise Reduction and Linearity Improvement in Time-Mode CMOS Image Sensors
title_sort fixed pattern noise reduction and linearity improvement in time-mode cmos image sensors
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7588900/
https://www.ncbi.nlm.nih.gov/pubmed/33092284
http://dx.doi.org/10.3390/s20205921
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