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Anomaly Detection in Discrete Manufacturing Systems by Pattern Relation Table Approaches
Anomaly detection for discrete manufacturing systems is important in intelligent manufacturing. In this paper, we address the problem of anomaly detection for the discrete manufacturing systems with complicated processes, including parallel processes, loop processes, and/or parallel with nested loop...
Autores principales: | Sun, Xinmiao, Li, Ruiqi, Yuan, Zhen |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7601565/ https://www.ncbi.nlm.nih.gov/pubmed/33053690 http://dx.doi.org/10.3390/s20205766 |
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