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Automatic Sorting System for Rigid Piezoelectric Transducer Wafers Used in Displacement Adjustment
Piezoelectric transducer wafers are usually used in pairs to adjust the resonant cavity length of the ring laser gyro. In practice, the paired wafers are required to have similar piezoelectric charge coefficient d(31). To handle the pairing operation in-batch, an automatic sorting system was develop...
Autores principales: | , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7601652/ https://www.ncbi.nlm.nih.gov/pubmed/33008034 http://dx.doi.org/10.3390/mi11100915 |
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author | Ren, Tongqun Li, Xin Wang, Xiaodong Xu, Zheng Liu, Yugang Yang, Jin Guo, Jiang |
author_facet | Ren, Tongqun Li, Xin Wang, Xiaodong Xu, Zheng Liu, Yugang Yang, Jin Guo, Jiang |
author_sort | Ren, Tongqun |
collection | PubMed |
description | Piezoelectric transducer wafers are usually used in pairs to adjust the resonant cavity length of the ring laser gyro. In practice, the paired wafers are required to have similar piezoelectric charge coefficient d(31). To handle the pairing operation in-batch, an automatic sorting system was developed on the basis of deformation measurement, which adopted a frame of a Cartesian-coordinate robot. The wafers were self-aligned in the vertical direction, and a vacuum holder was used to pick up, transfer, and then place them on thee testing desk one by one. The excitation voltage was loaded on the wafer by a specifically designed electrode, and the resulting micro deformation was measured by dual opposite inductive micrometers using the relative measurement principle. This particular electrode has the function of attitude self-adjustment and vacuum adsorption, which is conducive to loading the voltage reliably and protecting the wafer from undesired damage. Finally, the wafers were transported to different stock bins based on the measuring results. This system is suited to handle a mass of wafers by continuous processing on site for its high reliability and measurement consistency. The measurement accuracy, validated by laser interferometry, was better than 0.5 μm and the repeatability was superior to 0.1 μm. |
format | Online Article Text |
id | pubmed-7601652 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-76016522020-11-01 Automatic Sorting System for Rigid Piezoelectric Transducer Wafers Used in Displacement Adjustment Ren, Tongqun Li, Xin Wang, Xiaodong Xu, Zheng Liu, Yugang Yang, Jin Guo, Jiang Micromachines (Basel) Article Piezoelectric transducer wafers are usually used in pairs to adjust the resonant cavity length of the ring laser gyro. In practice, the paired wafers are required to have similar piezoelectric charge coefficient d(31). To handle the pairing operation in-batch, an automatic sorting system was developed on the basis of deformation measurement, which adopted a frame of a Cartesian-coordinate robot. The wafers were self-aligned in the vertical direction, and a vacuum holder was used to pick up, transfer, and then place them on thee testing desk one by one. The excitation voltage was loaded on the wafer by a specifically designed electrode, and the resulting micro deformation was measured by dual opposite inductive micrometers using the relative measurement principle. This particular electrode has the function of attitude self-adjustment and vacuum adsorption, which is conducive to loading the voltage reliably and protecting the wafer from undesired damage. Finally, the wafers were transported to different stock bins based on the measuring results. This system is suited to handle a mass of wafers by continuous processing on site for its high reliability and measurement consistency. The measurement accuracy, validated by laser interferometry, was better than 0.5 μm and the repeatability was superior to 0.1 μm. MDPI 2020-09-30 /pmc/articles/PMC7601652/ /pubmed/33008034 http://dx.doi.org/10.3390/mi11100915 Text en © 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Ren, Tongqun Li, Xin Wang, Xiaodong Xu, Zheng Liu, Yugang Yang, Jin Guo, Jiang Automatic Sorting System for Rigid Piezoelectric Transducer Wafers Used in Displacement Adjustment |
title | Automatic Sorting System for Rigid Piezoelectric Transducer Wafers Used in Displacement Adjustment |
title_full | Automatic Sorting System for Rigid Piezoelectric Transducer Wafers Used in Displacement Adjustment |
title_fullStr | Automatic Sorting System for Rigid Piezoelectric Transducer Wafers Used in Displacement Adjustment |
title_full_unstemmed | Automatic Sorting System for Rigid Piezoelectric Transducer Wafers Used in Displacement Adjustment |
title_short | Automatic Sorting System for Rigid Piezoelectric Transducer Wafers Used in Displacement Adjustment |
title_sort | automatic sorting system for rigid piezoelectric transducer wafers used in displacement adjustment |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7601652/ https://www.ncbi.nlm.nih.gov/pubmed/33008034 http://dx.doi.org/10.3390/mi11100915 |
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