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Hard X-ray ptychography for optics characterization using a partially coherent synchrotron source

Ptychography is a scanning coherent diffraction imaging technique which provides high resolution imaging and complete spatial information of the complex electric field probe and sample transmission function. Its ability to accurately determine the illumination probe has led to its use at modern sync...

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Autores principales: Moxham, Thomas E. J., Parsons, Aaron, Zhou, Tunhe, Alianelli, Lucia, Wang, Hongchang, Laundy, David, Dhamgaye, Vishal, Fox, Oliver J. L., Sawhney, Kawal, Korsunsky, Alexander M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7642961/
https://www.ncbi.nlm.nih.gov/pubmed/33147195
http://dx.doi.org/10.1107/S1600577520012151
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author Moxham, Thomas E. J.
Parsons, Aaron
Zhou, Tunhe
Alianelli, Lucia
Wang, Hongchang
Laundy, David
Dhamgaye, Vishal
Fox, Oliver J. L.
Sawhney, Kawal
Korsunsky, Alexander M.
author_facet Moxham, Thomas E. J.
Parsons, Aaron
Zhou, Tunhe
Alianelli, Lucia
Wang, Hongchang
Laundy, David
Dhamgaye, Vishal
Fox, Oliver J. L.
Sawhney, Kawal
Korsunsky, Alexander M.
author_sort Moxham, Thomas E. J.
collection PubMed
description Ptychography is a scanning coherent diffraction imaging technique which provides high resolution imaging and complete spatial information of the complex electric field probe and sample transmission function. Its ability to accurately determine the illumination probe has led to its use at modern synchrotrons and free-electron lasers as a wavefront-sensing technique for optics alignment, monitoring and correction. Recent developments in the ptychography reconstruction process now incorporate a modal decomposition of the illuminating probe and relax the restriction of using sources with high spatial coherence. In this article a practical implementation of hard X-ray ptychography from a partially coherent X-ray source with a large number of modes is demonstrated experimentally. A strongly diffracting Siemens star test sample is imaged using the focused beam produced by either a Fresnel zone plate or beryllium compound refractive lens. The recovered probe from each optic is back propagated in order to plot the beam caustic and determine the precise focal size and position. The power distribution of the reconstructed probe modes also allows the quantification of the beams coherence and is compared with the values predicted by a Gaussian–Schell model and the optics exit intensity.
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spelling pubmed-76429612020-11-17 Hard X-ray ptychography for optics characterization using a partially coherent synchrotron source Moxham, Thomas E. J. Parsons, Aaron Zhou, Tunhe Alianelli, Lucia Wang, Hongchang Laundy, David Dhamgaye, Vishal Fox, Oliver J. L. Sawhney, Kawal Korsunsky, Alexander M. J Synchrotron Radiat Research Papers Ptychography is a scanning coherent diffraction imaging technique which provides high resolution imaging and complete spatial information of the complex electric field probe and sample transmission function. Its ability to accurately determine the illumination probe has led to its use at modern synchrotrons and free-electron lasers as a wavefront-sensing technique for optics alignment, monitoring and correction. Recent developments in the ptychography reconstruction process now incorporate a modal decomposition of the illuminating probe and relax the restriction of using sources with high spatial coherence. In this article a practical implementation of hard X-ray ptychography from a partially coherent X-ray source with a large number of modes is demonstrated experimentally. A strongly diffracting Siemens star test sample is imaged using the focused beam produced by either a Fresnel zone plate or beryllium compound refractive lens. The recovered probe from each optic is back propagated in order to plot the beam caustic and determine the precise focal size and position. The power distribution of the reconstructed probe modes also allows the quantification of the beams coherence and is compared with the values predicted by a Gaussian–Schell model and the optics exit intensity. International Union of Crystallography 2020-10-16 /pmc/articles/PMC7642961/ /pubmed/33147195 http://dx.doi.org/10.1107/S1600577520012151 Text en © Thomas E. J. Moxham et al. 2020 http://creativecommons.org/licenses/by/4.0/ This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.http://creativecommons.org/licenses/by/4.0/
spellingShingle Research Papers
Moxham, Thomas E. J.
Parsons, Aaron
Zhou, Tunhe
Alianelli, Lucia
Wang, Hongchang
Laundy, David
Dhamgaye, Vishal
Fox, Oliver J. L.
Sawhney, Kawal
Korsunsky, Alexander M.
Hard X-ray ptychography for optics characterization using a partially coherent synchrotron source
title Hard X-ray ptychography for optics characterization using a partially coherent synchrotron source
title_full Hard X-ray ptychography for optics characterization using a partially coherent synchrotron source
title_fullStr Hard X-ray ptychography for optics characterization using a partially coherent synchrotron source
title_full_unstemmed Hard X-ray ptychography for optics characterization using a partially coherent synchrotron source
title_short Hard X-ray ptychography for optics characterization using a partially coherent synchrotron source
title_sort hard x-ray ptychography for optics characterization using a partially coherent synchrotron source
topic Research Papers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7642961/
https://www.ncbi.nlm.nih.gov/pubmed/33147195
http://dx.doi.org/10.1107/S1600577520012151
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