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Unveiling the high-temperature dielectric response of [Formula: see text]
Understanding the physics behind changes in dielectric permittivity and mechanical response with temperature and frequency in lead-free ferroic materials is a fundamental key to achieve optimal properties and to guarantee good performance in the technological applications envisaged. In this work, de...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7656463/ https://www.ncbi.nlm.nih.gov/pubmed/33173063 http://dx.doi.org/10.1038/s41598-020-75859-z |
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author | Diaz, Julio Cesar Camilo Albornoz M’Peko, Jean-Claude Venet, Michel da Silva, Paulo Sergio |
author_facet | Diaz, Julio Cesar Camilo Albornoz M’Peko, Jean-Claude Venet, Michel da Silva, Paulo Sergio |
author_sort | Diaz, Julio Cesar Camilo Albornoz |
collection | PubMed |
description | Understanding the physics behind changes in dielectric permittivity and mechanical response with temperature and frequency in lead-free ferroic materials is a fundamental key to achieve optimal properties and to guarantee good performance in the technological applications envisaged. In this work, dense [Formula: see text] (BNT) electroceramics were prepared through solid-state reaction of high-grade oxide reagents, followed by sintering at high temperature (1393 K for 3 h). In good agreement with previous reports in the literature, the thermal behaviour of dielectric response from these BNT materials showed the occurrence of a high-temperature diffuse-like permittivity peak, whose origin has been so far controversial. Thermally stimulated depolarization current, impedance and mechanical spectroscopies measurements were here conducted, over a wide range of temperature and frequency, to get a deep insight into the mechanism behind of this event. The approach included considering both as-sintered and reduced BNT samples, from which it is demonstrated that the broad high-temperature dielectric peak originates from interfacial polarization involving oxygen vacancies-related space-charge effects that develop at the grain-to-grain contacts. This mechanism, that contributes to the anomalous behavior observed in the mechanical response at low frequencies, could also be responsible for the presence of ferroelastic domains up to high temperatures. |
format | Online Article Text |
id | pubmed-7656463 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-76564632020-11-12 Unveiling the high-temperature dielectric response of [Formula: see text] Diaz, Julio Cesar Camilo Albornoz M’Peko, Jean-Claude Venet, Michel da Silva, Paulo Sergio Sci Rep Article Understanding the physics behind changes in dielectric permittivity and mechanical response with temperature and frequency in lead-free ferroic materials is a fundamental key to achieve optimal properties and to guarantee good performance in the technological applications envisaged. In this work, dense [Formula: see text] (BNT) electroceramics were prepared through solid-state reaction of high-grade oxide reagents, followed by sintering at high temperature (1393 K for 3 h). In good agreement with previous reports in the literature, the thermal behaviour of dielectric response from these BNT materials showed the occurrence of a high-temperature diffuse-like permittivity peak, whose origin has been so far controversial. Thermally stimulated depolarization current, impedance and mechanical spectroscopies measurements were here conducted, over a wide range of temperature and frequency, to get a deep insight into the mechanism behind of this event. The approach included considering both as-sintered and reduced BNT samples, from which it is demonstrated that the broad high-temperature dielectric peak originates from interfacial polarization involving oxygen vacancies-related space-charge effects that develop at the grain-to-grain contacts. This mechanism, that contributes to the anomalous behavior observed in the mechanical response at low frequencies, could also be responsible for the presence of ferroelastic domains up to high temperatures. Nature Publishing Group UK 2020-11-10 /pmc/articles/PMC7656463/ /pubmed/33173063 http://dx.doi.org/10.1038/s41598-020-75859-z Text en © The Author(s) 2020 Open AccessThis article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/. |
spellingShingle | Article Diaz, Julio Cesar Camilo Albornoz M’Peko, Jean-Claude Venet, Michel da Silva, Paulo Sergio Unveiling the high-temperature dielectric response of [Formula: see text] |
title | Unveiling the high-temperature dielectric response of [Formula: see text] |
title_full | Unveiling the high-temperature dielectric response of [Formula: see text] |
title_fullStr | Unveiling the high-temperature dielectric response of [Formula: see text] |
title_full_unstemmed | Unveiling the high-temperature dielectric response of [Formula: see text] |
title_short | Unveiling the high-temperature dielectric response of [Formula: see text] |
title_sort | unveiling the high-temperature dielectric response of [formula: see text] |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7656463/ https://www.ncbi.nlm.nih.gov/pubmed/33173063 http://dx.doi.org/10.1038/s41598-020-75859-z |
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