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Dynamics of Molecules Observed at Crude-Oil–Gas Interfaces by Time-of-Flight Secondary Ion Mass Spectrometry Imaging

[Image: see text] Time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging provides molecular speciation at the micrometer scale, while the penetration depth of the primary ion beam is limited to the top-layers of a sample. These combined properties make TOF-SIMS potentially an ideal techni...

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Detalles Bibliográficos
Autores principales:	Arisz, P. W. F., Pureveen, J. B. M., Heeren, R. M. A.
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	American Chemical Society 2020
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7659392/ https://www.ncbi.nlm.nih.gov/pubmed/33034445 http://dx.doi.org/10.1021/jasms.0c00290

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