Technostress Dark Side of Technology in the Workplace: A Scientometric Analysis

This article aims to provide a critical review of the scientific research on technostress. As such, global references in this field are identified and highlighted in order to manage pre-existing knowledge and establish future ‘bridges’ among researchers, and to enhance the presently dispersed unders...

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Detalles Bibliográficos
Autores principales: Bondanini, Giorgia, Giorgi, Gabriele, Ariza-Montes, Antonio, Vega-Muñoz, Alejandro, Andreucci-Annunziata, Paola
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Review
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7662498/
https://www.ncbi.nlm.nih.gov/pubmed/33143270
http://dx.doi.org/10.3390/ijerph17218013

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7662498/
https://www.ncbi.nlm.nih.gov/pubmed/33143270
http://dx.doi.org/10.3390/ijerph17218013

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