Cargando…
Technostress Dark Side of Technology in the Workplace: A Scientometric Analysis
This article aims to provide a critical review of the scientific research on technostress. As such, global references in this field are identified and highlighted in order to manage pre-existing knowledge and establish future ‘bridges’ among researchers, and to enhance the presently dispersed unders...
| Autores principales: | , , , , |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2020
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7662498/ https://www.ncbi.nlm.nih.gov/pubmed/33143270 http://dx.doi.org/10.3390/ijerph17218013 |