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Attosecond metrology in a continuous-beam transmission electron microscope
Electron microscopy can visualize the structure of complex materials with atomic and subatomic resolution, but investigations of reaction dynamics and light-matter interaction call for time resolution as well, ideally on a level below the oscillation period of light. Here, we report the use of the o...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
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American Association for the Advancement of Science
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7673721/ https://www.ncbi.nlm.nih.gov/pubmed/33177078 http://dx.doi.org/10.1126/sciadv.abb1393 |
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author | Ryabov, A. Thurner, J. W. Nabben, D. Tsarev, M. V. Baum, P. |
author_facet | Ryabov, A. Thurner, J. W. Nabben, D. Tsarev, M. V. Baum, P. |
author_sort | Ryabov, A. |
collection | PubMed |
description | Electron microscopy can visualize the structure of complex materials with atomic and subatomic resolution, but investigations of reaction dynamics and light-matter interaction call for time resolution as well, ideally on a level below the oscillation period of light. Here, we report the use of the optical cycles of a continuous-wave laser to bunch the electron beam inside a transmission electron microscope into electron pulses that are shorter than half a cycle of light. The pulses arrive at the target at almost the full average brightness of the electron source and in synchrony to the optical cycles, providing attosecond time resolution of spectroscopic features. The necessary modifications are simple and can turn almost any electron microscope into an attosecond instrument that may be useful for visualizing the inner workings of light-matter interaction on the basis of the atoms and the cycles of light. |
format | Online Article Text |
id | pubmed-7673721 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | American Association for the Advancement of Science |
record_format | MEDLINE/PubMed |
spelling | pubmed-76737212020-11-24 Attosecond metrology in a continuous-beam transmission electron microscope Ryabov, A. Thurner, J. W. Nabben, D. Tsarev, M. V. Baum, P. Sci Adv Research Articles Electron microscopy can visualize the structure of complex materials with atomic and subatomic resolution, but investigations of reaction dynamics and light-matter interaction call for time resolution as well, ideally on a level below the oscillation period of light. Here, we report the use of the optical cycles of a continuous-wave laser to bunch the electron beam inside a transmission electron microscope into electron pulses that are shorter than half a cycle of light. The pulses arrive at the target at almost the full average brightness of the electron source and in synchrony to the optical cycles, providing attosecond time resolution of spectroscopic features. The necessary modifications are simple and can turn almost any electron microscope into an attosecond instrument that may be useful for visualizing the inner workings of light-matter interaction on the basis of the atoms and the cycles of light. American Association for the Advancement of Science 2020-11-11 /pmc/articles/PMC7673721/ /pubmed/33177078 http://dx.doi.org/10.1126/sciadv.abb1393 Text en Copyright © 2020 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science. No claim to original U.S. Government Works. Distributed under a Creative Commons Attribution NonCommercial License 4.0 (CC BY-NC). https://creativecommons.org/licenses/by-nc/4.0/ https://creativecommons.org/licenses/by-nc/4.0/This is an open-access article distributed under the terms of the Creative Commons Attribution-NonCommercial license (https://creativecommons.org/licenses/by-nc/4.0/) , which permits use, distribution, and reproduction in any medium, so long as the resultant use is not for commercial advantage and provided the original work is properly cited. |
spellingShingle | Research Articles Ryabov, A. Thurner, J. W. Nabben, D. Tsarev, M. V. Baum, P. Attosecond metrology in a continuous-beam transmission electron microscope |
title | Attosecond metrology in a continuous-beam transmission electron microscope |
title_full | Attosecond metrology in a continuous-beam transmission electron microscope |
title_fullStr | Attosecond metrology in a continuous-beam transmission electron microscope |
title_full_unstemmed | Attosecond metrology in a continuous-beam transmission electron microscope |
title_short | Attosecond metrology in a continuous-beam transmission electron microscope |
title_sort | attosecond metrology in a continuous-beam transmission electron microscope |
topic | Research Articles |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7673721/ https://www.ncbi.nlm.nih.gov/pubmed/33177078 http://dx.doi.org/10.1126/sciadv.abb1393 |
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