Precise nanoscale temperature mapping in operational microelectronic devices by use of a phase change material

The microelectronics industry is pushing the fundamental limit on the physical size of individual elements to produce faster and more powerful integrated chips. These chips have nanoscale features that dissipate power resulting in nanoscale hotspots leading to device failures. To understand the reli...

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Detalles Bibliográficos
Autores principales: Cheng, Qilong, Rajauria, Sukumar, Schreck, Erhard, Smith, Robert, Wang, Na, Reiner, Jim, Dai, Qing, Bogy, David
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7674486/
https://www.ncbi.nlm.nih.gov/pubmed/33208765
http://dx.doi.org/10.1038/s41598-020-77021-1

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7674486/
https://www.ncbi.nlm.nih.gov/pubmed/33208765
http://dx.doi.org/10.1038/s41598-020-77021-1

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