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Precise nanoscale temperature mapping in operational microelectronic devices by use of a phase change material
The microelectronics industry is pushing the fundamental limit on the physical size of individual elements to produce faster and more powerful integrated chips. These chips have nanoscale features that dissipate power resulting in nanoscale hotspots leading to device failures. To understand the reli...
| Autores principales: | , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2020
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7674486/ https://www.ncbi.nlm.nih.gov/pubmed/33208765 http://dx.doi.org/10.1038/s41598-020-77021-1 |