Cargando…
Study on the Microstructure of Polyether Ether Ketone Films Irradiated with 170 keV Protons by Grazing Incidence Small Angle X-ray Scattering (GISAXS) Technology
Polyether ether ketone (PEEK) films irradiated with 170 keV protons were calculated by the stopping and ranges of ions in matter (SRIM) software. The results showed that the damage caused by 170 keV protons was only several microns of the PEEK surface, and the ionization absorbed dose and displaceme...
Autores principales: | , , , , |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2020
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7698423/ https://www.ncbi.nlm.nih.gov/pubmed/33212888 http://dx.doi.org/10.3390/polym12112717 |
_version_ | 1783615827384205312 |
---|---|
author | Li, Hongxia Yang, Jianqun Tian, Feng Li, Xingji Dong, Shangli |
author_facet | Li, Hongxia Yang, Jianqun Tian, Feng Li, Xingji Dong, Shangli |
author_sort | Li, Hongxia |
collection | PubMed |
description | Polyether ether ketone (PEEK) films irradiated with 170 keV protons were calculated by the stopping and ranges of ions in matter (SRIM) software. The results showed that the damage caused by 170 keV protons was only several microns of the PEEK surface, and the ionization absorbed dose and displacement absorbed dose were calculated. The surface morphology and roughness of PEEK after proton irradiation were studied by atomic force microscope (AFM). GISAXS was used to analyze the surface structural information of the pristine and irradiated PEEK. The experimental results showed that near the surface of the pristine and irradiated PEEK exists a peak, and the peak gradually disappeared with the increasing of the angles of incidence and the peak changed after irradiation, which implies the 170 keV protons have an effect on PEEK structure. The influences of PEEK irradiated with protons on the melting temperature and crystallization temperature was investigated by differential scanning calorimetry (DSC). The DSC results showed that the crystallinity of the polymer after irradiation decreased. The structure and content of free radicals of pristine and irradiated PEEK were studied by Fourier transform infrared spectroscopy (FTIR) and electron paramagnetic resonance (EPR). The stress and strain test results showed that the yield strength of the PEEK irradiated with 5 × 10(15) p/cm(2) and 1 × 10(16) p/cm(2) was higher than the pristine, but the elongation at break of the PEEK irradiated with 5 × 10(15) p/cm(2) and 1 × 10(16) p/cm(2) decreased obviously. |
format | Online Article Text |
id | pubmed-7698423 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-76984232020-11-29 Study on the Microstructure of Polyether Ether Ketone Films Irradiated with 170 keV Protons by Grazing Incidence Small Angle X-ray Scattering (GISAXS) Technology Li, Hongxia Yang, Jianqun Tian, Feng Li, Xingji Dong, Shangli Polymers (Basel) Article Polyether ether ketone (PEEK) films irradiated with 170 keV protons were calculated by the stopping and ranges of ions in matter (SRIM) software. The results showed that the damage caused by 170 keV protons was only several microns of the PEEK surface, and the ionization absorbed dose and displacement absorbed dose were calculated. The surface morphology and roughness of PEEK after proton irradiation were studied by atomic force microscope (AFM). GISAXS was used to analyze the surface structural information of the pristine and irradiated PEEK. The experimental results showed that near the surface of the pristine and irradiated PEEK exists a peak, and the peak gradually disappeared with the increasing of the angles of incidence and the peak changed after irradiation, which implies the 170 keV protons have an effect on PEEK structure. The influences of PEEK irradiated with protons on the melting temperature and crystallization temperature was investigated by differential scanning calorimetry (DSC). The DSC results showed that the crystallinity of the polymer after irradiation decreased. The structure and content of free radicals of pristine and irradiated PEEK were studied by Fourier transform infrared spectroscopy (FTIR) and electron paramagnetic resonance (EPR). The stress and strain test results showed that the yield strength of the PEEK irradiated with 5 × 10(15) p/cm(2) and 1 × 10(16) p/cm(2) was higher than the pristine, but the elongation at break of the PEEK irradiated with 5 × 10(15) p/cm(2) and 1 × 10(16) p/cm(2) decreased obviously. MDPI 2020-11-17 /pmc/articles/PMC7698423/ /pubmed/33212888 http://dx.doi.org/10.3390/polym12112717 Text en © 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Li, Hongxia Yang, Jianqun Tian, Feng Li, Xingji Dong, Shangli Study on the Microstructure of Polyether Ether Ketone Films Irradiated with 170 keV Protons by Grazing Incidence Small Angle X-ray Scattering (GISAXS) Technology |
title | Study on the Microstructure of Polyether Ether Ketone Films Irradiated with 170 keV Protons by Grazing Incidence Small Angle X-ray Scattering (GISAXS) Technology |
title_full | Study on the Microstructure of Polyether Ether Ketone Films Irradiated with 170 keV Protons by Grazing Incidence Small Angle X-ray Scattering (GISAXS) Technology |
title_fullStr | Study on the Microstructure of Polyether Ether Ketone Films Irradiated with 170 keV Protons by Grazing Incidence Small Angle X-ray Scattering (GISAXS) Technology |
title_full_unstemmed | Study on the Microstructure of Polyether Ether Ketone Films Irradiated with 170 keV Protons by Grazing Incidence Small Angle X-ray Scattering (GISAXS) Technology |
title_short | Study on the Microstructure of Polyether Ether Ketone Films Irradiated with 170 keV Protons by Grazing Incidence Small Angle X-ray Scattering (GISAXS) Technology |
title_sort | study on the microstructure of polyether ether ketone films irradiated with 170 kev protons by grazing incidence small angle x-ray scattering (gisaxs) technology |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7698423/ https://www.ncbi.nlm.nih.gov/pubmed/33212888 http://dx.doi.org/10.3390/polym12112717 |
work_keys_str_mv | AT lihongxia studyonthemicrostructureofpolyetheretherketonefilmsirradiatedwith170kevprotonsbygrazingincidencesmallanglexrayscatteringgisaxstechnology AT yangjianqun studyonthemicrostructureofpolyetheretherketonefilmsirradiatedwith170kevprotonsbygrazingincidencesmallanglexrayscatteringgisaxstechnology AT tianfeng studyonthemicrostructureofpolyetheretherketonefilmsirradiatedwith170kevprotonsbygrazingincidencesmallanglexrayscatteringgisaxstechnology AT lixingji studyonthemicrostructureofpolyetheretherketonefilmsirradiatedwith170kevprotonsbygrazingincidencesmallanglexrayscatteringgisaxstechnology AT dongshangli studyonthemicrostructureofpolyetheretherketonefilmsirradiatedwith170kevprotonsbygrazingincidencesmallanglexrayscatteringgisaxstechnology |