Study on the Microstructure of Polyether Ether Ketone Films Irradiated with 170 keV Protons by Grazing Incidence Small Angle X-ray Scattering (GISAXS) Technology

Polyether ether ketone (PEEK) films irradiated with 170 keV protons were calculated by the stopping and ranges of ions in matter (SRIM) software. The results showed that the damage caused by 170 keV protons was only several microns of the PEEK surface, and the ionization absorbed dose and displaceme...

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Detalles Bibliográficos
Autores principales: Li, Hongxia, Yang, Jianqun, Tian, Feng, Li, Xingji, Dong, Shangli
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7698423/
https://www.ncbi.nlm.nih.gov/pubmed/33212888
http://dx.doi.org/10.3390/polym12112717

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7698423/
https://www.ncbi.nlm.nih.gov/pubmed/33212888
http://dx.doi.org/10.3390/polym12112717

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