speckle-tracking: a software suite for ptychographic X-ray speckle tracking

In recent years, X-ray speckle-tracking techniques have emerged as viable tools for wavefront metrology and sample imaging applications. These methods are based on the measurement of near-field images. Thanks to their simple experimental setup, high angular sensitivity and compatibility with low-coh...

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Detalles Bibliográficos
Autores principales: Morgan, Andrew J., Murray, Kevin T., Quiney, Harry M., Bajt, Saša, Chapman, Henry N.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2020
Materias:
Computer Programs
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7710491/
https://www.ncbi.nlm.nih.gov/pubmed/33304226
http://dx.doi.org/10.1107/S1600576720011991

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7710491/
https://www.ncbi.nlm.nih.gov/pubmed/33304226
http://dx.doi.org/10.1107/S1600576720011991

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