Cargando…
speckle-tracking: a software suite for ptychographic X-ray speckle tracking
In recent years, X-ray speckle-tracking techniques have emerged as viable tools for wavefront metrology and sample imaging applications. These methods are based on the measurement of near-field images. Thanks to their simple experimental setup, high angular sensitivity and compatibility with low-coh...
| Autores principales: | , , , , |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2020
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7710491/ https://www.ncbi.nlm.nih.gov/pubmed/33304226 http://dx.doi.org/10.1107/S1600576720011991 |