Artificial Magnetic Pattern Arrays Probed by Polarized Neutron Reflectivity

Traditionally, neutron scattering is an essential method for the analysis of spin structures and spin excitations in bulk materials. Over the last 30 years, polarized neutron scattering in terms of reflectometry has also contributed largely to the analysis of magnetic thin films and magnetic multila...

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Detalles Bibliográficos
Autores principales: Gorkov, Dmitry, Toperverg, Boris P., Zabel, Hartmut
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7711518/
https://www.ncbi.nlm.nih.gov/pubmed/32354026
http://dx.doi.org/10.3390/nano10050851

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7711518/
https://www.ncbi.nlm.nih.gov/pubmed/32354026
http://dx.doi.org/10.3390/nano10050851

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