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Description and validation of a circular padding method for linear roughness measurements of short data lengths
Surface topography measurements are vital in industrial quality control. Linear roughness measurements are among the most preferred methods, being quick to perform and easy to interpret. The ISO 16610 standard series prescribes filters that can be used for most cases, but has limitations for restric...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Elsevier
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7724204/ https://www.ncbi.nlm.nih.gov/pubmed/33318953 http://dx.doi.org/10.1016/j.mex.2020.101122 |
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author | Schoeters, Stijn Dewulf, Wim Kruth, Jean-Pierre Haitjema, Han Boeckmans, Bart |
author_facet | Schoeters, Stijn Dewulf, Wim Kruth, Jean-Pierre Haitjema, Han Boeckmans, Bart |
author_sort | Schoeters, Stijn |
collection | PubMed |
description | Surface topography measurements are vital in industrial quality control. Linear roughness measurements are among the most preferred methods, being quick to perform and easy to interpret. The ISO 16610 standard series prescribes filters that can be used for most cases, but has limitations for restricted measurement lengths. This is because the standard filter type is a Gaussian filter, which like most instances of kernel convolution filters has no output near the edges of the profile, effectively shortening the length of the filtered output profile as compared to the input. In some cases, this leads to a lack of representative data after filtration. Especially in fields such as Additive Manufacturing (AM) this becomes a problem, due to the high “roughness to measurable data length”-ratio that characterizes complex AM parts. This paper describes a method that allows to overcome this limitation: • A method for circular padding of short measured tracks is described and validated. • A flexible profile data post-processing tool was developed in MATLAB to grant users more control over the data analysis. Results obtained from roughness profiles long enough for normal ISO procedures are shown to not change significantly when circularly padded. When only a shorter section of the data is available, where the standard protocol would not be able to compute a filtered profile and related parameters anymore, the circular padding method is shown to lead to results that are in good agreement with the ISO standard procedures. |
format | Online Article Text |
id | pubmed-7724204 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | Elsevier |
record_format | MEDLINE/PubMed |
spelling | pubmed-77242042020-12-13 Description and validation of a circular padding method for linear roughness measurements of short data lengths Schoeters, Stijn Dewulf, Wim Kruth, Jean-Pierre Haitjema, Han Boeckmans, Bart MethodsX Method Article Surface topography measurements are vital in industrial quality control. Linear roughness measurements are among the most preferred methods, being quick to perform and easy to interpret. The ISO 16610 standard series prescribes filters that can be used for most cases, but has limitations for restricted measurement lengths. This is because the standard filter type is a Gaussian filter, which like most instances of kernel convolution filters has no output near the edges of the profile, effectively shortening the length of the filtered output profile as compared to the input. In some cases, this leads to a lack of representative data after filtration. Especially in fields such as Additive Manufacturing (AM) this becomes a problem, due to the high “roughness to measurable data length”-ratio that characterizes complex AM parts. This paper describes a method that allows to overcome this limitation: • A method for circular padding of short measured tracks is described and validated. • A flexible profile data post-processing tool was developed in MATLAB to grant users more control over the data analysis. Results obtained from roughness profiles long enough for normal ISO procedures are shown to not change significantly when circularly padded. When only a shorter section of the data is available, where the standard protocol would not be able to compute a filtered profile and related parameters anymore, the circular padding method is shown to lead to results that are in good agreement with the ISO standard procedures. Elsevier 2020-11-17 /pmc/articles/PMC7724204/ /pubmed/33318953 http://dx.doi.org/10.1016/j.mex.2020.101122 Text en © 2020 The Authors. Published by Elsevier B.V. http://creativecommons.org/licenses/by/4.0/ This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Method Article Schoeters, Stijn Dewulf, Wim Kruth, Jean-Pierre Haitjema, Han Boeckmans, Bart Description and validation of a circular padding method for linear roughness measurements of short data lengths |
title | Description and validation of a circular padding method for linear roughness measurements of short data lengths |
title_full | Description and validation of a circular padding method for linear roughness measurements of short data lengths |
title_fullStr | Description and validation of a circular padding method for linear roughness measurements of short data lengths |
title_full_unstemmed | Description and validation of a circular padding method for linear roughness measurements of short data lengths |
title_short | Description and validation of a circular padding method for linear roughness measurements of short data lengths |
title_sort | description and validation of a circular padding method for linear roughness measurements of short data lengths |
topic | Method Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7724204/ https://www.ncbi.nlm.nih.gov/pubmed/33318953 http://dx.doi.org/10.1016/j.mex.2020.101122 |
work_keys_str_mv | AT schoetersstijn descriptionandvalidationofacircularpaddingmethodforlinearroughnessmeasurementsofshortdatalengths AT dewulfwim descriptionandvalidationofacircularpaddingmethodforlinearroughnessmeasurementsofshortdatalengths AT kruthjeanpierre descriptionandvalidationofacircularpaddingmethodforlinearroughnessmeasurementsofshortdatalengths AT haitjemahan descriptionandvalidationofacircularpaddingmethodforlinearroughnessmeasurementsofshortdatalengths AT boeckmansbart descriptionandvalidationofacircularpaddingmethodforlinearroughnessmeasurementsofshortdatalengths |