Transient Electrical and Optical Characteristics of Electron and Proton Irradiated SiGe Detectors

The particle detector degradation mainly appears through decrease of carrier recombination lifetime and manifestation of carrier trapping effects related to introduction of carrier capture and emission centers. In this work, the carrier trap spectroscopy in Si(1−x)Ge(x) structures, containing either...

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Detalles Bibliográficos
Autores principales: Ceponis, Tomas, Deveikis, Laimonas, Lastovskii, Stanislau, Makarenko, Leonid, Pavlov, Jevgenij, Pukas, Kornelijus, Rumbauskas, Vytautas, Gaubas, Eugenijus
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7730890/
https://www.ncbi.nlm.nih.gov/pubmed/33276481
http://dx.doi.org/10.3390/s20236884

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7730890/
https://www.ncbi.nlm.nih.gov/pubmed/33276481
http://dx.doi.org/10.3390/s20236884

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