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Field Emission Air-Channel Devices as a Voltage Adder
Field emission air-channel (FEAC) devices can work under atmospheric pressure with a low operation voltage when the electron channel is far less than the mean free path (MFP) in the air, thereby making them a practical component in circuits. Forward and reverse electron emissions of the current FEAC...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7760484/ https://www.ncbi.nlm.nih.gov/pubmed/33260308 http://dx.doi.org/10.3390/nano10122378 |
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author | Chang, Wen-Teng Cheng, Ming-Chih Chuang, Tsung-Ying Tsai, Ming-Yen |
author_facet | Chang, Wen-Teng Cheng, Ming-Chih Chuang, Tsung-Ying Tsai, Ming-Yen |
author_sort | Chang, Wen-Teng |
collection | PubMed |
description | Field emission air-channel (FEAC) devices can work under atmospheric pressure with a low operation voltage when the electron channel is far less than the mean free path (MFP) in the air, thereby making them a practical component in circuits. Forward and reverse electron emissions of the current FEAC devices demonstrated symmetric Fowler–Nordheim (F–N) plots owing to the symmetric cathode and anode electrodes. This research aimed to demonstrate the arithmetic application of the FEAC devices, their substrate effect, and reliability. A voltage adder was composed of two FEAC devices whose two inputs were connected to two separate function generators, and one output was wire-connected to an oscilloscope. The devices were on a thin dielectric film and low-resistivity silicon substrate to evaluate the parasitic components and substrate effect, resulting in frequency-dependent impedance. The results show that the FEAC devices possessed arithmetic function, but the output voltage decreased. The FEAC devices were still capable of serving as a voltage adder after the reliability test, but electric current leakage increased. Finite element analysis indicated that the highest electrical fields and electron trajectories occur at the apices where the electrons travel with the shortest route less than the MFP in the air, thereby meeting the FEAC devices’ design. The modeling also showed that a sharp apex would generate a high electric field at the tip-gap-tip, enhancing the tunneling current. |
format | Online Article Text |
id | pubmed-7760484 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-77604842020-12-26 Field Emission Air-Channel Devices as a Voltage Adder Chang, Wen-Teng Cheng, Ming-Chih Chuang, Tsung-Ying Tsai, Ming-Yen Nanomaterials (Basel) Article Field emission air-channel (FEAC) devices can work under atmospheric pressure with a low operation voltage when the electron channel is far less than the mean free path (MFP) in the air, thereby making them a practical component in circuits. Forward and reverse electron emissions of the current FEAC devices demonstrated symmetric Fowler–Nordheim (F–N) plots owing to the symmetric cathode and anode electrodes. This research aimed to demonstrate the arithmetic application of the FEAC devices, their substrate effect, and reliability. A voltage adder was composed of two FEAC devices whose two inputs were connected to two separate function generators, and one output was wire-connected to an oscilloscope. The devices were on a thin dielectric film and low-resistivity silicon substrate to evaluate the parasitic components and substrate effect, resulting in frequency-dependent impedance. The results show that the FEAC devices possessed arithmetic function, but the output voltage decreased. The FEAC devices were still capable of serving as a voltage adder after the reliability test, but electric current leakage increased. Finite element analysis indicated that the highest electrical fields and electron trajectories occur at the apices where the electrons travel with the shortest route less than the MFP in the air, thereby meeting the FEAC devices’ design. The modeling also showed that a sharp apex would generate a high electric field at the tip-gap-tip, enhancing the tunneling current. MDPI 2020-11-29 /pmc/articles/PMC7760484/ /pubmed/33260308 http://dx.doi.org/10.3390/nano10122378 Text en © 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Chang, Wen-Teng Cheng, Ming-Chih Chuang, Tsung-Ying Tsai, Ming-Yen Field Emission Air-Channel Devices as a Voltage Adder |
title | Field Emission Air-Channel Devices as a Voltage Adder |
title_full | Field Emission Air-Channel Devices as a Voltage Adder |
title_fullStr | Field Emission Air-Channel Devices as a Voltage Adder |
title_full_unstemmed | Field Emission Air-Channel Devices as a Voltage Adder |
title_short | Field Emission Air-Channel Devices as a Voltage Adder |
title_sort | field emission air-channel devices as a voltage adder |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7760484/ https://www.ncbi.nlm.nih.gov/pubmed/33260308 http://dx.doi.org/10.3390/nano10122378 |
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