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Band Gap Measurements of Nano-Meter Sized Rutile Thin Films

Thin Titanium films were fabricated on quartz substrates by radio frequency magnetron sputtering under high vacuum. Subsequent annealing at temperatures of 600 [Formula: see text] C in air resulted in single-phase [Formula: see text] with the structure of rutile, as X-ray diffraction experiment demo...

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Autores principales: Diamantopoulos, Nikolaos C., Barnasas, Alexandros, Garoufalis, Christos. S., Anyfantis, Dimitrios I., Bouropoulos, Nikolaos, Poulopoulos, Panagiotis, Baskoutas, Sotirios
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7761142/
https://www.ncbi.nlm.nih.gov/pubmed/33260313
http://dx.doi.org/10.3390/nano10122379
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author Diamantopoulos, Nikolaos C.
Barnasas, Alexandros
Garoufalis, Christos. S.
Anyfantis, Dimitrios I.
Bouropoulos, Nikolaos
Poulopoulos, Panagiotis
Baskoutas, Sotirios
author_facet Diamantopoulos, Nikolaos C.
Barnasas, Alexandros
Garoufalis, Christos. S.
Anyfantis, Dimitrios I.
Bouropoulos, Nikolaos
Poulopoulos, Panagiotis
Baskoutas, Sotirios
author_sort Diamantopoulos, Nikolaos C.
collection PubMed
description Thin Titanium films were fabricated on quartz substrates by radio frequency magnetron sputtering under high vacuum. Subsequent annealing at temperatures of 600 [Formula: see text] C in air resulted in single-phase [Formula: see text] with the structure of rutile, as X-ray diffraction experiment demonstrates. Atomic-force microscopy images verify the high crystalline quality and allow us to determine the grain size even for ultrathin [Formula: see text] films. Rutile has a direct energy band gap at about 3.0–3.2 eV; however, the transitions between the valence and conduction band are dipole forbidden. Just a few meV above that, there is an indirect band gap. The first intense absorption peak appears at about 4 eV. Tauc plots for the position of the indirect band gap show a “blue shift” with decreasing film thickness. Moreover, we find a similar shift for the position of the first absorbance peak studied by the derivative method. The results indicate the presence of quantum confinement effects. This conclusion is supported by theoretical calculations based on a combination of the effective mass theory and the Hartree Fock approximation.
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spelling pubmed-77611422020-12-26 Band Gap Measurements of Nano-Meter Sized Rutile Thin Films Diamantopoulos, Nikolaos C. Barnasas, Alexandros Garoufalis, Christos. S. Anyfantis, Dimitrios I. Bouropoulos, Nikolaos Poulopoulos, Panagiotis Baskoutas, Sotirios Nanomaterials (Basel) Article Thin Titanium films were fabricated on quartz substrates by radio frequency magnetron sputtering under high vacuum. Subsequent annealing at temperatures of 600 [Formula: see text] C in air resulted in single-phase [Formula: see text] with the structure of rutile, as X-ray diffraction experiment demonstrates. Atomic-force microscopy images verify the high crystalline quality and allow us to determine the grain size even for ultrathin [Formula: see text] films. Rutile has a direct energy band gap at about 3.0–3.2 eV; however, the transitions between the valence and conduction band are dipole forbidden. Just a few meV above that, there is an indirect band gap. The first intense absorption peak appears at about 4 eV. Tauc plots for the position of the indirect band gap show a “blue shift” with decreasing film thickness. Moreover, we find a similar shift for the position of the first absorbance peak studied by the derivative method. The results indicate the presence of quantum confinement effects. This conclusion is supported by theoretical calculations based on a combination of the effective mass theory and the Hartree Fock approximation. MDPI 2020-11-29 /pmc/articles/PMC7761142/ /pubmed/33260313 http://dx.doi.org/10.3390/nano10122379 Text en © 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Diamantopoulos, Nikolaos C.
Barnasas, Alexandros
Garoufalis, Christos. S.
Anyfantis, Dimitrios I.
Bouropoulos, Nikolaos
Poulopoulos, Panagiotis
Baskoutas, Sotirios
Band Gap Measurements of Nano-Meter Sized Rutile Thin Films
title Band Gap Measurements of Nano-Meter Sized Rutile Thin Films
title_full Band Gap Measurements of Nano-Meter Sized Rutile Thin Films
title_fullStr Band Gap Measurements of Nano-Meter Sized Rutile Thin Films
title_full_unstemmed Band Gap Measurements of Nano-Meter Sized Rutile Thin Films
title_short Band Gap Measurements of Nano-Meter Sized Rutile Thin Films
title_sort band gap measurements of nano-meter sized rutile thin films
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7761142/
https://www.ncbi.nlm.nih.gov/pubmed/33260313
http://dx.doi.org/10.3390/nano10122379
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