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Band Gap Measurements of Nano-Meter Sized Rutile Thin Films
Thin Titanium films were fabricated on quartz substrates by radio frequency magnetron sputtering under high vacuum. Subsequent annealing at temperatures of 600 [Formula: see text] C in air resulted in single-phase [Formula: see text] with the structure of rutile, as X-ray diffraction experiment demo...
Autores principales: | , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7761142/ https://www.ncbi.nlm.nih.gov/pubmed/33260313 http://dx.doi.org/10.3390/nano10122379 |
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author | Diamantopoulos, Nikolaos C. Barnasas, Alexandros Garoufalis, Christos. S. Anyfantis, Dimitrios I. Bouropoulos, Nikolaos Poulopoulos, Panagiotis Baskoutas, Sotirios |
author_facet | Diamantopoulos, Nikolaos C. Barnasas, Alexandros Garoufalis, Christos. S. Anyfantis, Dimitrios I. Bouropoulos, Nikolaos Poulopoulos, Panagiotis Baskoutas, Sotirios |
author_sort | Diamantopoulos, Nikolaos C. |
collection | PubMed |
description | Thin Titanium films were fabricated on quartz substrates by radio frequency magnetron sputtering under high vacuum. Subsequent annealing at temperatures of 600 [Formula: see text] C in air resulted in single-phase [Formula: see text] with the structure of rutile, as X-ray diffraction experiment demonstrates. Atomic-force microscopy images verify the high crystalline quality and allow us to determine the grain size even for ultrathin [Formula: see text] films. Rutile has a direct energy band gap at about 3.0–3.2 eV; however, the transitions between the valence and conduction band are dipole forbidden. Just a few meV above that, there is an indirect band gap. The first intense absorption peak appears at about 4 eV. Tauc plots for the position of the indirect band gap show a “blue shift” with decreasing film thickness. Moreover, we find a similar shift for the position of the first absorbance peak studied by the derivative method. The results indicate the presence of quantum confinement effects. This conclusion is supported by theoretical calculations based on a combination of the effective mass theory and the Hartree Fock approximation. |
format | Online Article Text |
id | pubmed-7761142 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-77611422020-12-26 Band Gap Measurements of Nano-Meter Sized Rutile Thin Films Diamantopoulos, Nikolaos C. Barnasas, Alexandros Garoufalis, Christos. S. Anyfantis, Dimitrios I. Bouropoulos, Nikolaos Poulopoulos, Panagiotis Baskoutas, Sotirios Nanomaterials (Basel) Article Thin Titanium films were fabricated on quartz substrates by radio frequency magnetron sputtering under high vacuum. Subsequent annealing at temperatures of 600 [Formula: see text] C in air resulted in single-phase [Formula: see text] with the structure of rutile, as X-ray diffraction experiment demonstrates. Atomic-force microscopy images verify the high crystalline quality and allow us to determine the grain size even for ultrathin [Formula: see text] films. Rutile has a direct energy band gap at about 3.0–3.2 eV; however, the transitions between the valence and conduction band are dipole forbidden. Just a few meV above that, there is an indirect band gap. The first intense absorption peak appears at about 4 eV. Tauc plots for the position of the indirect band gap show a “blue shift” with decreasing film thickness. Moreover, we find a similar shift for the position of the first absorbance peak studied by the derivative method. The results indicate the presence of quantum confinement effects. This conclusion is supported by theoretical calculations based on a combination of the effective mass theory and the Hartree Fock approximation. MDPI 2020-11-29 /pmc/articles/PMC7761142/ /pubmed/33260313 http://dx.doi.org/10.3390/nano10122379 Text en © 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Diamantopoulos, Nikolaos C. Barnasas, Alexandros Garoufalis, Christos. S. Anyfantis, Dimitrios I. Bouropoulos, Nikolaos Poulopoulos, Panagiotis Baskoutas, Sotirios Band Gap Measurements of Nano-Meter Sized Rutile Thin Films |
title | Band Gap Measurements of Nano-Meter Sized Rutile Thin Films |
title_full | Band Gap Measurements of Nano-Meter Sized Rutile Thin Films |
title_fullStr | Band Gap Measurements of Nano-Meter Sized Rutile Thin Films |
title_full_unstemmed | Band Gap Measurements of Nano-Meter Sized Rutile Thin Films |
title_short | Band Gap Measurements of Nano-Meter Sized Rutile Thin Films |
title_sort | band gap measurements of nano-meter sized rutile thin films |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7761142/ https://www.ncbi.nlm.nih.gov/pubmed/33260313 http://dx.doi.org/10.3390/nano10122379 |
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