Band Gap Measurements of Nano-Meter Sized Rutile Thin Films

Thin Titanium films were fabricated on quartz substrates by radio frequency magnetron sputtering under high vacuum. Subsequent annealing at temperatures of 600 [Formula: see text] C in air resulted in single-phase [Formula: see text] with the structure of rutile, as X-ray diffraction experiment demo...

Descripción completa

Detalles Bibliográficos
Autores principales: Diamantopoulos, Nikolaos C., Barnasas, Alexandros, Garoufalis, Christos. S., Anyfantis, Dimitrios I., Bouropoulos, Nikolaos, Poulopoulos, Panagiotis, Baskoutas, Sotirios
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7761142/
https://www.ncbi.nlm.nih.gov/pubmed/33260313
http://dx.doi.org/10.3390/nano10122379

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7761142/
https://www.ncbi.nlm.nih.gov/pubmed/33260313
http://dx.doi.org/10.3390/nano10122379

Ejemplares similares