Surface and build‐up dose comparison between Elekta 6 MV flattening filter and flattening‐filter‐free beams using an advanced Markus ionization chamber and a solid water‐equivalent phantom

Using a plane‐parallel advanced Markus ionization chamber and a stack of water‐equivalent solid phantom blocks, percentage surface and build‐up doses of Elekta 6 MV flattening filter (FF) and flattening‐filter‐free (FFF) beams were measured as a function of the phantom depth for field sizes ranging...

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Detalles Bibliográficos
Autores principales: Imae, Toshikazu, Takenaka, Shigeharu, Watanabe, Yuichi, Aoki, Atsushi, Matsuda, Kanako, Sasaki, Katsutake, Saegusa, Shigeki, Nawa, Kanabu, Nakagawa, Keiichi, Abe, Osamu
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2020
Materias:
Technical Notes
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7769389/
https://www.ncbi.nlm.nih.gov/pubmed/33184970
http://dx.doi.org/10.1002/acm2.13094

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