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General method to calculate the elastic deformation and X-ray diffraction properties of bent crystal wafers

Toroidally and spherically bent single crystals are widely employed as optical elements in hard X-ray spectrometry at synchrotron and free-electron laser light sources, and in laboratory-scale instruments. To achieve optimal spectrometer performance, a solid theoretical understanding of the diffract...

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Detalles Bibliográficos
Autores principales:	Honkanen, Ari-Pekka, Huotari, Simo
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	International Union of Crystallography 2021
Materias:	Research Papers
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7793001/ https://www.ncbi.nlm.nih.gov/pubmed/33520246 http://dx.doi.org/10.1107/S2052252520014165

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