Intrinsic Dielectric Loss in Zr(0.8)Sn(0.2)TiO(4) Ceramics Investigated by Terahertz Time Domain Spectroscopy

Terahertz time-domain spectroscopy (THz-TDS) was employed for estimation of intrinsic dielectric loss of Zr(0.8)Sn(0.2)TiO(4) (ZST) ceramics. Single-phase ZST dielectric resonators (DRs) with various synthesis parameters and, consequently, different extrinsic losses, were prepared by conventional ce...

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Detalles Bibliográficos
Autores principales: Nedelcu, Liviu, Geambasu, Cezar Dragos, Enculescu, Monica, Banciu, Marian Gabriel
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Communication
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7794686/
https://www.ncbi.nlm.nih.gov/pubmed/33466267
http://dx.doi.org/10.3390/ma14010216
Descripción
Sumario:Terahertz time-domain spectroscopy (THz-TDS) was employed for estimation of intrinsic dielectric loss of Zr(0.8)Sn(0.2)TiO(4) (ZST) ceramics. Single-phase ZST dielectric resonators (DRs) with various synthesis parameters and, consequently, different extrinsic losses, were prepared by conventional ceramic technology. Even though the DRs exhibit a similar microstructure, their quality factor (Q is the inverse of dielectric loss tangent) measured in microwave (MW) domain at 6 GHz varies between 2500 and 8400. On the other hand, it was found that the THz dielectric loss is less sensitive to the sample preparation. The intrinsic losses (Q × f ~60 THz) of the ZST ceramics have been derived from THz data.

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