Grain Boundary Control of Organic Semiconductors via Solvent Vapor Annealing for High-Sensitivity NO(2) Detection

The microstructure of the organic semiconductor (OSC) active layer is one of the crucial topics to improve the sensing performance of gas sensors. Herein, we introduce a simple solvent vapor annealing (SVA) process to control 6,13-bis(triisopropylsilylethynyl)-pentacene (TIPS-pentacene) OSC films mo...

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Detalles Bibliográficos
Autores principales: Hou, Sihui, Zhuang, Xinming, Fan, Huidong, Yu, Junsheng
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Letter
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7794992/
https://www.ncbi.nlm.nih.gov/pubmed/33401403
http://dx.doi.org/10.3390/s21010226

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7794992/
https://www.ncbi.nlm.nih.gov/pubmed/33401403
http://dx.doi.org/10.3390/s21010226

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